Depletion of PCBM at the cathode interface in P3HT/ PCBM thin films as quantified via neutron reflectivity measurements

Advanced Materials

Volumn 22, Issue 22, 2010, Pages 2444-2447

  Parnell, A J ^a   Dunbar, Alan D F ^b   Pearson, Andrew J ^a   Staniec, Paul A ^a   Dennison, Andrew J C ^a   Hamamatsu, Hiroshi ^a   Skoda, Maximilian W A ^c   Lidzey, David C ^a   Jones, Richard A L ^a  

^a Hicks Building   (United Kingdom)

^b UNIVERSITY OF SHEFFIELD   (United Kingdom)

^c RUTHERFORD APPLETON LABORATORY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALED FILMS; ELECTRON EXTRACTION; NEUTRON REFLECTIVITY; NEUTRON REFLECTIVITY MEASUREMENTS; PHOTOVOLTAIC DEVICES; SELF-STRATIFICATION; THERMAL-ANNEALING; TOP SURFACE;

REFLECTION;

ANNEALING;

(6,6) PHENYL C61 BUTYRIC ACID METHYL ESTER; (6,6)-PHENYL C61-BUTYRIC ACID METHYL ESTER; FULLERENE DERIVATIVE; POLY(3 HEXYLTHIOPHENE); POLY(3-HEXYLTHIOPHENE); THIOPHENE DERIVATIVE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; ELECTRODE; NEUTRON; SOLAR ENERGY;

ELECTRODES; FULLERENES; MICROSCOPY, ATOMIC FORCE; NEUTRONS; SOLAR ENERGY; THIOPHENES;

EID: 77953518534     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.200903971     Document Type: Article

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