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Volumn 54, Issue 8, 2001, Pages 487-491

Characterization of Thin-Film Surfaces and Interfaces Using Neutron Reflectometry

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0442307987     PISSN: 00049425     EISSN: None     Source Type: Journal    
DOI: 10.1071/CH01132     Document Type: Article
Times cited : (6)

References (27)
  • 26
    • 0442290347 scopus 로고    scopus 로고
    • Further information may be obtained at the Australian Nuclear Science and Technology Organisations Neutron Scattering Group web pages (http://www.ansto.gov.au/ansto/neut/ nsrrr.html).
  • 27
    • 0442290350 scopus 로고    scopus 로고
    • Further information may be obtained at the AINSE web pages (http://www.ansto.gov.au/ainse/index.html).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.