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Physical Review Letters

Volumn 110, Issue 17, 2013, Pages

Accurate and facile determination of the index of refraction of organic thin films near the carbon 1s absorption Edge

(4) Yan, Hongping a Wang, Cheng b McCarn, Allison R a Ade, Harald a

a NORTH CAROLINA STATE UNIVERSITY (United States)

b LAWRENCE BERKELEY NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION EDGES; HIGH CONFIDENCE; INDEX OF REFRACTION; MEASUREMENTS OF; ORGANIC MATERIALS; ORGANIC THIN FILMS; REFLECTIVITY DATA; SPECULAR REFLECTIVITY;

CARBON; ESTERS; OPTICAL CONSTANTS; THIN FILMS;

REFRACTIVE INDEX;

EID: 84876732829 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.110.177401 Document Type: Article

Times cited : (31)

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