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Volumn 27, Issue 12, 2002, Pages 1028-1030

Direct measurement of index of refraction in the extreme-ultraviolet wavelength region with a novel interferometer

(6) Chang, Chang a Anderson, Erik a Naulleau, Patrick a Gullikson, Eric a Goldberg, Kenneth a Attwood, David a

a UNIVERSITY OF CALIFORNIA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; DIFFRACTION GRATINGS; INTERFEROMETERS; LIGHT ABSORPTION; PHOTONS; ULTRAVIOLET RADIATION;

EXTREME-ULTRAVIOLET (EUV) WAVELENGTHS;

REFRACTIVE INDEX;

EID: 0037097624 PISSN: 01469592 EISSN: None Source Type: Journal
DOI: 10.1364/OL.27.001028 Document Type: Article

Times cited : (30)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.