Peak forces in high-resolution imaging of soft matter in liquid

ACS Nano

Volumn 7, Issue 4, 2013, Pages 3198-3204

  Guzman, Horacio V ^a   Perrino, Alma P ^a   Garcia, Ricardo ^a  

^a INSTITUTO DE CIENCIA DE MATERIALES DE MADRID   (Spain)

Author keywords

deformation; force microscopy; nanomechanics; peak forces; soft matter

Indexed keywords

FORCE MICROSCOPY; HIGH-RESOLUTION IMAGING; OPERATIONAL CONDITIONS; OPERATIONAL PARAMETERS; PEAK FORCE; SOFT MATTER; THREE-DIMENSIONAL MAPS; VISCOELASTIC RESPONSE;

DEFORMATION; NANOMECHANICS;

IMAGE RECONSTRUCTION;

NANOMATERIAL; SOLUTION AND SOLUBILITY;

ARTICLE; CHEMISTRY; HARDNESS; MATERIALS TESTING; MECHANICAL STRESS; METHODOLOGY; MOLECULAR IMAGING; PARTICLE SIZE; SOLUTION AND SOLUBILITY; ULTRASTRUCTURE; VISCOSITY; YOUNG MODULUS; PROCEDURES;

ELASTIC MODULUS; HARDNESS; MATERIALS TESTING; MOLECULAR IMAGING; NANOSTRUCTURES; PARTICLE SIZE; SOLUTIONS; STRESS, MECHANICAL; VISCOSITY;

EID: 84876588045     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn4012835     Document Type: Article

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