Quantitative measurement of solvation shells using frequency modulated atomic force microscopy

Nanotechnology

Volumn 16, Issue 3, 2005, Pages

  Uchihashi, T ^a   Higgins, M ^a   Nakayama, Y ^b   Sader, J E ^a,c   Jarvis, S P ^a  

^a TRINITY COLLEGE DUBLIN   (Ireland)

^b Osaka City University   (Japan)

^c UNIVERSITY OF MELBOURNE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; COMPOSITION; FREQUENCY MODULATION; HYDROGEN BONDS; HYDROPHILICITY; MOLECULAR STRUCTURE; NANOSTRUCTURED MATERIALS; SURFACE PROPERTIES;

CHEMICAL EFFECTS; DATA SETS; FREQUENCY SHIFT; SOLVATION SHELLS;

ADSORPTION;

EID: 15844372310     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/16/3/009     Document Type: Conference Paper

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