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Volumn 46, Issue 17, 2013, Pages

Magnetic and structural studies of LaMnO3 thin films prepared by atomic layer deposition

(10) Khanduri, H a,b Chandra Dimri, M a Vasala, S c Leinberg, S d Lohmus R d Ashworth, T V e Mere, A b Krustok, J b Karppinen, M c Stern, R a

a NATIONAL INSTITUTE OF CHEMICAL PHYSICS AND BIOPHYSICS (Estonia)

b TALLINN UNIVERSITY OF TECHNOLOGY (Estonia)

c AALTO UNIVERSITY (Finland)

d UNIVERSITY OF TARTU (Estonia)

e NanoScan AG (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING ATMOSPHERES; BULK SAMPLES; MICRO-STRUCTURAL; OXYGEN STOICHIOMETRY; PEROVSKITE CRYSTAL STRUCTURE; PROPERTY CHARACTERIZATIONS; STRUCTURAL STUDIES; VARYING THICKNESS;

ANNEALING; ATOMIC LAYER DEPOSITION; DEPOSITION; MAGNETIC PROPERTIES; RAMAN SPECTROSCOPY; STOICHIOMETRY; THIN FILMS; X RAY DIFFRACTION;

FILM PREPARATION;

EID: 84876494853 PISSN: 00223727 EISSN: 13616463 Source Type: Journal
DOI: 10.1088/0022-3727/46/17/175003 Document Type: Article

Times cited : (25)

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