Influence of annealing temperature on the structural, topographical and optical properties of sol-gel derived ZnO thin films

Materials Letters

Volumn 65, Issue 17-18, 2011, Pages 2572-2574

  Sengupta, Joydip ^a   Sahoo, R K ^b   Bardhan, K K ^a   Mukherjee, C D ^a  

^a SAHA INSTITUTE OF NUCLEAR PHYSICS   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY   (India)

Author keywords

Annealing; Atomic force microscopy; Optical properties; Sol gel preparation; X ray diffraction; Zinc oxide thin film

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; FILM PREPARATION; OPTICAL PROPERTIES; OXIDE FILMS; SOL-GEL PROCESS; SOL-GELS; THIN FILMS; X RAY DIFFRACTION; ZINC; ZINC OXIDE;

ANNEALING TEMPERATURES; CRYSTALLINITIES; EFFECT OF ANNEALING; PREFERRED ORIENTATIONS; SOL GEL PREPARATIONS; TOPOGRAPHICAL MODIFICATIONS; UV-VISIBLE SPECTROPHOTOMETER; ZINC OXIDE THIN FILMS;

OPTICAL FILMS;

EID: 79959554246     PISSN: 0167577X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matlet.2011.06.021     Document Type: Article

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