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Volumn 24, Issue 18, 2013, Pages

Electrical transport and electromigration studies on nickel encapsulated carbon nanotubes: Possible future interconnects

Author keywords

[No Author keywords available]

Indexed keywords

COPPER INTERCONNECTS; EFFECTIVE SOLUTION; ELECTRICAL TRANSPORT; FILLED CARBON NANOTUBES; HIGH CURRENT DENSITIES; INTERCONNECT TECHNOLOGY; METAL-FILLED CARBON NANOTUBES; PERFORMANCE AND RELIABILITIES;

EID: 84876490577     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/24/18/185201     Document Type: Article
Times cited : (6)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.