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Review of Scientific Instruments

Volumn 84, Issue 3, 2013, Pages

Surface-sensitive conductivity measurement using a micro multi-point probe approach

(4) Perkins, Edward a Barreto, Lucas a Wells, Justin b Hofmann, Philip a

a AARHUS UNIVERSITY (Denmark)

b NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

APPLICATION EXAMPLES; CONDUCTIVITY MEASUREMENTS; CONTACT SPACINGS; CURRENT/VOLTAGE MEASUREMENTS; ELECTRICAL TRANSPORT MEASUREMENTS; EPITAXIAL GRAPHENE; FOUR-POINT PROBE; RESISTANCE MEASUREMENT;

ERROR ANALYSIS; GRAPHENE; SEMICONDUCTING SELENIUM COMPOUNDS; SILICON CARBIDE;

PROBES;

EID: 84875787229 PISSN: 00346748 EISSN: None Source Type: Journal
DOI: 10.1063/1.4793376 Document Type: Article

Times cited : (26)

References (29)

1
- 64149119106
- 10.1088/0953-8984/21/1/013003
- Ph. Hofmann and J. W. Wells, J. Phys.: Condens. Matter 21, 013003 (2009). 10.1088/0953-8984/21/1/013003
- (2009) J. Phys.: Condens. Matter , vol.21 , pp. 013003
- Hofmann, Ph.¹ Wells, J.W.²

2
- 37649032759
- 10.1103/PhysRevLett.93.236801
- I. Matsuda, M. Ueno, T. Hirahara, R. Hobara, H. Morikawa, C. Liu, and S. Hasegawa, Phys. Rev. Lett. 93, 236801 (2004). 10.1103/PhysRevLett.93.236801
- (2004) Phys. Rev. Lett. , vol.93 , pp. 236801
- Matsuda, I.¹ Ueno, M.² Hirahara, T.³ Hobara, R.⁴ Morikawa, H.⁵ Liu, C.⁶ Hasegawa, S.⁷

3
- 34248178956
- 10.1021/nl0630182
- S. Yoshimoto, Y. Murata, K. Kubo, K. Tomita, K. Motoyoshi, T. Kimura, H. Okino, R. Hobara, I. Matsuda, S. Honda, Nano Lett. 7, 956 (2007). 10.1021/nl0630182
- (2007) Nano Lett. , vol.7 , pp. 956
- Yoshimoto, S.¹ Murata, Y.² Kubo, K.³ Tomita, K.⁴ Motoyoshi, K.⁵ Kimura, T.⁶ Okino, H.⁷ Hobara, R.⁸ Matsuda, I.⁹ Honda, S.¹⁰

4
- 0034205014
- 10.1143/JJAP.39.3815
- S. Hasegawa, N. Sato, I. Shiraki, C. L. Petersen, P. Boggild, T. M. Hansen, T. Nagao, and F. Grey, Jpn. J. Appl. Phys., Part 1 39, 3815 (2000). 10.1143/JJAP.39.3815
- (2000) Jpn. J. Appl. Phys., Part 1 , vol.39 , pp. 3815
- Hasegawa, S.¹ Sato, N.² Shiraki, I.³ Petersen, C.L.⁴ Boggild, P.⁵ Hansen, T.M.⁶ Nagao, T.⁷ Grey, F.⁸

5
- 0034249812
- 10.1016/S0169-4332(00)00247-6
- O. Pfennigstorf, K. Lang, H. L. Gunter, and M. Henzler, Appl. Surf. Sci. 162, 537 (2000). 10.1016/S0169-4332(00)00247-6
- (2000) Appl. Surf. Sci. , vol.162 , pp. 537
- Pfennigstorf, O.¹ Lang, K.² Gunter, H.L.³ Henzler, M.⁴

6
- 3543116091
- 10.1103/PhysRevLett.93.016801
- T. Tanikawa, I. Matsuda, T. Kanagawa, and S. Hasegawa, Phys. Rev. Lett. 93, 016801 (2004). 10.1103/PhysRevLett.93.016801
- (2004) Phys. Rev. Lett. , vol.93 , pp. 016801
- Tanikawa, T.¹ Matsuda, I.² Kanagawa, T.³ Hasegawa, S.⁴

7
- 28844465490
- 10.1103/PhysRevLett.95.176804
- C. Tegenkamp, Z. Kallassy, H. Pfnur, H.-L. Gunter, V. Zielasek, and M. Henzler, Phys. Rev. Lett. 95, 176804 (2005). 10.1103/PhysRevLett.95.176804
- (2005) Phys. Rev. Lett. , vol.95 , pp. 176804
- Tegenkamp, C.¹ Kallassy, Z.² Pfnur, H.³ Gunter, H.-L.⁴ Zielasek, V.⁵ Henzler, M.⁶

8
- 33751068674
- 10.1103/PhysRevLett.97.206803
- J. W. Wells, J. F. Kallehauge, T. M. Hansen, and Ph. Hofmann, Phys. Rev. Lett. 97, 206803 (2006). 10.1103/PhysRevLett.97.206803
- (2006) Phys. Rev. Lett. , vol.97 , pp. 206803
- Wells, J.W.¹ Kallehauge, J.F.² Hansen, T.M.³ Hofmann, Ph.⁴

9
- 43849091193
- 10.1088/0953-8984/19/17/176008
- J. W. Wells, J. F. Kallehauge, and Ph. Hofmann, J. Phys.: Condens. Matter 19, 176008 (2007). 10.1088/0953-8984/19/17/176008
- (2007) J. Phys.: Condens. Matter , vol.19 , pp. 176008
- Wells, J.W.¹ Kallehauge, J.F.² Hofmann, Ph.³

10
- 80054941210
- 10.1088/0957-4484/22/44/445702
- M. B. Klarskov, H. F. Dam, D. H. Petersen, T. M. Hansen, A. Löwenborg, T. J. Booth, M. S. Schmidt, R. Lin, P. F. Nielsen, and P. Boggild, Nanotechnology 22, 445702 (2011). 10.1088/0957-4484/22/44/445702
- (2011) Nanotechnology , vol.22 , pp. 445702
- Klarskov, M.B.¹ Dam, H.F.² Petersen, D.H.³ Hansen, T.M.⁴ Löwenborg, A.⁵ Booth, T.J.⁶ Schmidt, M.S.⁷ Lin, R.⁸ Nielsen, P.F.⁹ Boggild, P.¹⁰

11
- 84872964778
- 10.1063/1.4789508
- L. Barreto, E. Perkins, J. C. Johannsen, S. Ulstrup, F. Fromm, C. Raidel, T. Seyller, and Ph. Hofmann, Appl. Phys. Lett. 102, 033110 (2013). 10.1063/1.4789508
- (2013) Appl. Phys. Lett. , vol.102 , pp. 033110
- Barreto, L.¹ Perkins, E.² Johannsen, J.C.³ Ulstrup, S.⁴ Fromm, F.⁵ Raidel, C.⁶ Seyller, T.⁷ Hofmann, Ph.⁸

12
- 77949375457
- 10.1038/nature08916
- J. E. Moore, Nature (London) 464, 194 (2010). 10.1038/nature08916
- (2010) Nature (London) , vol.464 , pp. 194
- Moore, J.E.¹

13
- 78349239882
- 10.1103/RevModPhys.82.3045
- M. Z. Hasan and C. L. Kane, Rev. Mod. Phys. 82, 3045 (2010). 10.1103/RevModPhys.82.3045
- (2010) Rev. Mod. Phys. , vol.82 , pp. 3045
- Hasan, M.Z.¹ Kane, C.L.²

14
- 80054934761
- 10.1103/RevModPhys.83.1057
- X.-L. Qi and S.-C. Zhang, Rev. Mod. Phys. 83, 1057 (2011). 10.1103/RevModPhys.83.1057
- (2011) Rev. Mod. Phys. , vol.83 , pp. 1057
- Qi, X.-L.¹ Zhang, S.-C.²

15
- 84868020435
- 10.1103/PhysRevLett.109.176801
- B. Skinner, T. Chen, and B. I. Shklovskii, Phys. Rev. Lett. 109, 176801 (2012). 10.1103/PhysRevLett.109.176801
- (2012) Phys. Rev. Lett. , vol.109 , pp. 176801
- Skinner, B.¹ Chen, T.² Shklovskii, B.I.³

16
- 0035500583
- 10.1016/S0039-6028(01)01276-6
- I. Shiraki, F. Tanabe, R. Hobara, T. Nagao, and S. Hasegawa, Surf. Sci. 493, 633 (2001). 10.1016/S0039-6028(01)01276-6
- (2001) Surf. Sci. , vol.493 , pp. 633
- Shiraki, I.¹ Tanabe, F.² Hobara, R.³ Nagao, T.⁴ Hasegawa, S.⁵

17
- 34249942733
- 10.1063/1.2735593
- R. Hobara, N. Nagamura, S. Hasegawa, I. Matsuda, Y. Yamamoto, Y. Miyatake, and T. Nagamura, Rev. Sci. Instrum. 78, 053705 (2007). 10.1063/1.2735593
- (2007) Rev. Sci. Instrum. , vol.78 , pp. 053705
- Hobara, R.¹ Nagamura, N.² Hasegawa, S.³ Matsuda, I.⁴ Yamamoto, Y.⁵ Miyatake, Y.⁶ Nagamura, T.⁷

18
- 84871758072
- 10.1063/1.4773485
- C. M. Polley, W. R. Clarke, J. A. Miwa, M. Y. Simmons, and J. W. Wells, Appl. Phys. Lett. 101, 262105 (2012). 10.1063/1.4773485
- (2012) Appl. Phys. Lett. , vol.101 , pp. 262105
- Polley, C.M.¹ Clarke, W.R.² Miwa, J.A.³ Simmons, M.Y.⁴ Wells, J.W.⁵

19
- 0037048123
- 10.1088/0953-8984/14/35/309
- S. Hasegawa, I. Shiraki, T. Tanikawa, C. Petersen, T. Hansen, P. Boggild, and F. Grey, J. Phys.: Condens. Matter 14, 8379 (2002). 10.1088/0953-8984/14/ 35/309
- (2002) J. Phys.: Condens. Matter , vol.14 , pp. 8379
- Hasegawa, S.¹ Shiraki, I.² Tanikawa, T.³ Petersen, C.⁴ Hansen, T.⁵ Boggild, P.⁶ Grey, F.⁷

20
- 51349131389
- 10.1063/1.2888746
- L. Gammelgaard, P. Boggild, J. W. Wells, K. Handrup, Ph. Hofmann, M. B. Balslev, J. E. Hansen, and P. R. E. Petersen, Appl. Phys. Lett. 93, 093104 (2008). 10.1063/1.2888746
- (2008) Appl. Phys. Lett. , vol.93 , pp. 093104
- Gammelgaard, L.¹ Boggild, P.² Wells, J.W.³ Handrup, K.⁴ Hofmann, Ph.⁵ Balslev, M.B.⁶ Hansen, J.E.⁷ Petersen, P.R.E.⁸

21
- 84937656620
- 10.1109/JRPROC.1952.273975
- L. Valdes, Proc. IRE 40, 1429 (1952). 10.1109/JRPROC.1952.273975
- (1952) Proc. IRE , vol.40 , pp. 1429
- Valdes, L.¹

22
- 51849091468
- 10.1063/1.2969769
- J. W. Wells, K. Handrup, J. F. Kallehauge, L. Gammelgaard, P. Boggild, M. B. Balslev, J. E. Hansen, P. R. E. Petersen, and Ph. Hofmann, J. Appl. Phys. 104, 053717 (2008). 10.1063/1.2969769
- (2008) J. Appl. Phys. , vol.104 , pp. 053717
- Wells, J.W.¹ Handrup, K.² Kallehauge, J.F.³ Gammelgaard, L.⁴ Boggild, P.⁵ Balslev, M.B.⁶ Hansen, J.E.⁷ Petersen, P.R.E.⁸ Hofmann, Ph.⁹

23
- 38849199342
- 10.1116/1.2794743
- D. H. Petersen, R. Lin, T. M. Hansen, E. Rosseel, W. Vandervorst, C. Markvardsen, D. Kjær, and P. F. Nielsen, J. Vac. Sci. Technol. B 26, 362 (2008). 10.1116/1.2794743
- (2008) J. Vac. Sci. Technol. B , vol.26 , pp. 362
- Petersen, D.H.¹ Lin, R.² Hansen, T.M.³ Rosseel, E.⁴ Vandervorst, W.⁵ Markvardsen, C.⁶ Kjær, D.⁷ Nielsen, P.F.⁸

24
- 77955735660
- 10.1103/PhysRevB.81.195434
- J. Jobst, D. Waldmann, F. Speck, R. Hirner, D. K. Maude, T. Seyller, and H. B. Weber, Phys. Rev. B 81, 195434 (2010). 10.1103/PhysRevB.81.195434
- (2010) Phys. Rev. B , vol.81 , pp. 195434
- Jobst, J.¹ Waldmann, D.² Speck, F.³ Hirner, R.⁴ Maude, D.K.⁵ Seyller, T.⁶ Weber, H.B.⁷

25
- 21044431911
- 10.1088/0953-8984/17/19/005
- A. Saji, S. Ampili, S.-H. Yang, K. J. Ku, and M. Elizabeth, J. Phys.: Condens. Matter 17, 2873 (2005). 10.1088/0953-8984/17/19/005
- (2005) J. Phys.: Condens. Matter , vol.17 , pp. 2873
- Saji, A.¹ Ampili, S.² Yang, S.-H.³ Ku, K.J.⁴ Elizabeth, M.⁵

26
- 80053412945
- 10.1063/1.3643034
- F. Speck, J. Jobst, F. Fromm, M. Ostler, D. Waldmann, M. Hundhausen, H. B. Weber, and T. Seyller, Appl. Phys. Lett. 99, 122106 (2011). 10.1063/1.3643034
- (2011) Appl. Phys. Lett. , vol.99 , pp. 122106
- Speck, F.¹ Jobst, J.² Fromm, F.³ Ostler, M.⁴ Waldmann, D.⁵ Hundhausen, M.⁶ Weber, H.B.⁷ Seyller, T.⁸

27
- 0001407335
- 10.1103/PhysRevB.58.16396
- I. Forbeaux, J.-M. Themlin, and J.-M. Debever, Phys. Rev. B 58, 16396 (1998). 10.1103/PhysRevB.58.16396
- (1998) Phys. Rev. B , vol.58 , pp. 16396
- Forbeaux, I.¹ Themlin, J.-M.² Debever, J.-M.³

28
- 72049105359
- 10.1103/PhysRevLett.103.246804
- C. Riedl, C. Coletti, T. Iwasaki, A. A. Zakharov, and U. Starke, Phys. Rev. Lett. 103, 246804 (2009). 10.1103/PhysRevLett.103.246804
- (2009) Phys. Rev. Lett. , vol.103 , pp. 246804
- Riedl, C.¹ Coletti, C.² Iwasaki, T.³ Zakharov, A.A.⁴ Starke, U.⁵

29
- 84875784023
- q.) here, and relative sensitivity in Ref. is referred to as corrected spacing
- q.) here, and relative sensitivity in Ref. is referred to as corrected spacing.

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