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Volumn 39, Issue 6 B, 2000, Pages 3815-3822

Surface-state bands on silicon - Si(111)-√3 × √3-Ag surface superstructure -

Author keywords

Four point probe; Scanning tunneling microscopy; Silicon surface; Surface electrical conduction; Surface electronic state; Surface superstructure

Indexed keywords

BAND STRUCTURE; CRYSTAL ATOMIC STRUCTURE; CRYSTAL ORIENTATION; ELECTRIC CONDUCTIVITY MEASUREMENT; ELECTRONIC STRUCTURE; GROUND STATE; SCANNING TUNNELING MICROSCOPY; SURFACE STRUCTURE;

EID: 0034205014     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.39.3815     Document Type: Article
Times cited : (56)

References (23)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.