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Journal of Alloys and Compounds

Volumn 566, Issue , 2013, Pages 9-15

Effect of post-annealing treatment on the microstructure and optical properties of ZnO/PS nanocomposite films

(6) Ma, S Y a Yang, X H a Huang, X L a Sun, A M a Song, H S a Zhu, H B a

a NORTHWEST NORMAL UNIVERSITY (China)

Author keywords

Optical properties; Porous silicon; RF magnetron sputtering; X ray diffraction; ZnO thin film

Indexed keywords

ELECTRO-CHEMICAL ANODIZATION; FLUORESCENCE SPECTROPHOTOMETRY; HEXAGONAL WURTZITE STRUCTURE; PHOTOLUMINESCENCE MEASUREMENTS; QUANTUM CONFINEMENT EFFECTS; RADIO FREQUENCY REACTIVE MAGNETRON SPUTTERING; RF-MAGNETRON SPUTTERING; ZNO THIN FILM;

ANNEALING; DEPOSITS; MAGNETRON SPUTTERING; MICROSTRUCTURE; NANOCOMPOSITE FILMS; OPTICAL PROPERTIES; POROUS SILICON; QUANTUM CONFINEMENT; SILICON WAFERS; ULTRAVIOLET VISIBLE SPECTROSCOPY; X RAY DIFFRACTION; ZINC OXIDE; ZINC SULFIDE;

METALLIC FILMS;

EID: 84875667055 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/j.jallcom.2013.02.179 Document Type: Article

Times cited : (26)

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