Compact metal probes: A solution for atomic force microscopy based tip-enhanced Raman spectroscopy

Review of Scientific Instruments

Volumn 83, Issue 12, 2012, Pages

  Rodriguez, R D ^a   Sheremet, E ^a   Muller S ^a   Gordan, O D ^a   Villabona, A ^a   Schulze, S ^a   Hietschold, M ^a   Zahn, D R T ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL COMPONENT; FULLY COMPATIBLE; LATERAL RESOLUTION; METALLIC COATING; SCANNING TUNNELING MICROSCOPES; SHEAR FORCE MICROSCOPE; SILICON CANTILEVER; TIP-ENHANCED RAMAN SPECTROSCOPY;

ATOMIC FORCE MICROSCOPY; METAL COATINGS; NANOCANTILEVERS; SILICON; SILICON NITRIDE;

EXPERIMENTS;

EID: 84875476635     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4770140     Document Type: Article

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