Atomic force and shear force based tip-enhanced Raman spectroscopy and imaging

Nanotechnology

Volumn 18, Issue 31, 2007, Pages

  Kharintsev, S S ^a,b   Hoffmann, G G ^a,c   Dorozhkin, P S ^d   De With, G ^a   Loos, J ^a  

^a EINDHOVEN UNIVERSITY OF TECHNOLOGY   (Netherlands)

^b KAZAN FEDERAL UNIVERSITY   (Russian Federation)

^c UNIVERSITY OF DUISBURG ESSEN   (Germany)

^d NT MDT   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY; VIBRATIONAL SPECTROSCOPY;

ATOMIC FORCE (AF); RAMAN IMAGING; SCANNING NEAR-FIELD OPTICAL SPECTROMETER; SHEAR FORCE (SF);

SINGLE-WALLED CARBON NANOTUBES (SWCN);

SINGLE WALLED NANOTUBE;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; EXPERIMENTAL STUDY; FORCE; IMAGE ENHANCEMENT; PARTICLE SIZE; PRIORITY JOURNAL; RAMAN SPECTROMETRY; SCANNING ELECTRON MICROSCOPY; SCANNING NEAR FIELD OPTICAL MICROSCOPY; SHEAR STRESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 34547094823     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/18/31/315502     Document Type: Article

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