Simulations of tip-enhanced optical microscopy reveal atomic resolution

Journal of Microscopy

Volumn 229, Issue 2, 2008, Pages 184-188

  Downes, Andrew ^a   Salter, Donald ^b   Elfick, Alistair ^a  

^a UNIVERSITY OF EDINBURGH   (United Kingdom)

^b UNIVERSITY OF EDINBURGH   (United Kingdom)

Author keywords

Apertureless; Atomic; Finite element; Near field; Resolution; SNOM; TERS

Indexed keywords

FINITE ELEMENT METHOD; NEAR FIELD SCANNING OPTICAL MICROSCOPY;

APERTURELESS; APERTURELESS SCANNING; ATOMIC; ATOMIC-RESOLUTION; ELECTROMAGNETIC ANALYSIS; FINITE ELEMENT; NEAR FIELDS; RESOLUTION; SCANNING NEAR-FIELD OPTICAL MICROSCOPE; TERS;

ATOMS;

ALUMINUM; COPPER; GOLD; SILVER; TUNGSTEN;

ABSORPTION SPECTROSCOPY; CONFERENCE PAPER; ELECTRIC FIELD; HYDROGEN BOND; LIGHT SCATTERING; MICROSCOPY; POLARIZATION; PRIORITY JOURNAL; SCANNING PROBE MICROSCOPY; SIMULATION;

EID: 40049100148     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.01884.x     Document Type: Conference Paper

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