ESD protection of BiCMOS integrated circuits which need to operate in the harsh environments of automotive or industrial

Electrical Overstress/Electrostatic Discharge Symposium Proceedings

Volumn , Issue , 1993, Pages 209-213

  Corsi, Marco ^a   Nimmo, Ross ^a   Fattori, Frank ^a  

^a TEXAS INSTRUMENTS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC BATTERIES; ELECTRIC DISCHARGES; ELECTRIC EQUIPMENT PROTECTION; ELECTRIC WAVEFORMS; ELECTRONIC EQUIPMENT TESTING; GATES (TRANSISTOR); INDUSTRIAL APPLICATIONS; INTEGRATED CIRCUIT LAYOUT; THYRISTORS;

BICMOS INTEGRATED CIRCUITS; ELECTROSTATIC DISCHARGE PROTECTION; ESOTERIC APPLICATION; HARSH ENVIRONMENTS;

CMOS INTEGRATED CIRCUITS;

EID: 0027883867     PISSN: 07395159     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (3)