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Optics Letters

Volumn 38, Issue 6, 2013, Pages 827-829

X-ray wavefront characterization of a Fresnel zone plate using a two-dimensional grating interferometer

(6) Wang, Hongchang a Berujon, Sebastien a,b Pape, Ian a Rutishauser, Simon c David, Christian c Sawhney, Kawal a

a DIAMOND LIGHT SOURCE LTD (United Kingdom)

b EUROPEAN SYNCHROTRON RADIATION FACILITY (France)

c PAUL SCHERRER INSTITUTE (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EXPERIMENTAL DATUM; FRESNEL ZONE PLATE; ONE-DIMENSIONAL COMPOUNDS; PHASE RECONSTRUCTION; THEORETICAL CALCULATIONS; TWO-DIMENSIONAL GRATING; WAVEFRONT ERRORS; WAVEFRONT MEASUREMENT;

ABERRATIONS; INTERFEROMETERS; TWO DIMENSIONAL; WAVEFRONTS;

X RAYS;

EID: 84875152959 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.38.000827 Document Type: Article

Times cited : (19)

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