Off-resonance conduction through atomic wires

Science

Volumn 272, Issue 5270, 1996, Pages 1921-1924

  Yazdani, Ali ^a   Eigler, D M ^a   Lang, N D ^b  

^a IBM ALMADEN RESEARCH CENTER   (United States)

^b IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

XENON;

ARTICLE; ATOM; ELECTRIC CONDUCTIVITY; ELECTRON TRANSPORT; MATHEMATICAL ANALYSIS; MOLECULAR DYNAMICS; PRIORITY JOURNAL;

EID: 0030037263     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.272.5270.1921     Document Type: Article

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12. We measured / versus V and dI/dV versus V; both measurements indicated that, to within 5%, there was no V dependence over the range ±30 mV to the resistances we report here.
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14. 7 ohms for an STM junction corresponds to a tip height above the surface of ∼7 Å. We have found Lang's calculation to be consistent with / versus D measurements taken on this same Ni surface (6). We used this calibration, together with the measured changes in tip height due to the presence of one or two Xe atoms in the junction, to determine the tip-surface separation.
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29. We thank D. J. Auerbach, R. Landauer, C. P. Lutz, and C. T. Rettner for helpful discussions. We are also indebted to C. P. Lutz for technical assistance.