In situ observation of nickel as an oxidizable electrode material for the solid-electrolyte-based resistive random access memory

Applied Physics Letters

Volumn 102, Issue 5, 2013, Pages

  Sun, Jun ^a   Liu, Qi ^b   Xie, Hongwei ^b   Wu, Xing ^a   Xu, Feng ^a   Xu, Tao ^a   Long, Shibing ^b   Lv, Hangbing ^b   Li, Yingtao ^b   Sun, Litao ^a   Liu, Ming ^b  

^a Southeast University   (China)

^b INSTITUTE OF MICROELECTRONICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE FILAMENTS; ELECTRODE MATERIAL; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; IN-SITU OBSERVATIONS; IN-SITU TRANSMISSION ELECTRON MICROSCOPIES; INCREASING TEMPERATURES; METALLIC CONDUCTION; NANO SCALE; NI NANOWIRES; ON-STATE RESISTANCE; PHYSICAL MECHANISM; PT ELECTRODE; REAL TIME; RESISTANCE-TEMPERATURE COEFFICIENTS; RESISTIVE RANDOM ACCESS MEMORY; RESISTIVE SWITCHING; RESISTIVE SWITCHING BEHAVIORS;

ELECTROLYTES; ELECTRON EMISSION; ENERGY DISPERSIVE SPECTROSCOPY; IN SITU PROCESSING; NANOWIRES; PLATINUM; SWITCHING SYSTEMS; TRANSMISSION ELECTRON MICROSCOPY;

NICKEL;

EID: 84874087343     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4790837     Document Type: Article

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