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Volumn 102, Issue 5, 2013, Pages

800 meV localization energy in GaSb/GaAs/Al0.3Ga0.7As quantum dots

Author keywords

[No Author keywords available]

Indexed keywords

ALTERNATIVE MATERIALS; CAPTURE CROSS SECTIONS; CARRIER STORAGE; GASB/GAAS; HOLE LOCALIZATION; LOCALIZATION ENERGY;

EID: 84874039268     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4791678     Document Type: Article
Times cited : (41)

References (29)
  • 16
    • 0016081559 scopus 로고
    • 10.1063/1.1663719
    • D. V. Lang, J. Appl. Phys. 45, 3023 (1974). 10.1063/1.1663719
    • (1974) J. Appl. Phys. , vol.45 , pp. 3023
    • Lang, D.V.1
  • 19
    • 0004101812 scopus 로고
    • Point Defects in Semiconductors II - Experimental Aspects
    • Springer, Berlin
    • J. Bourgoin and M. Lannoo, Point Defects in Semiconductors II-Experimental Aspects, Springer Series in Solid-State Sciences Vol. 35 (Springer, Berlin, 1983).
    • (1983) Springer Series in Solid-State Sciences , vol.35
    • Bourgoin, J.1    Lannoo, M.2
  • 25
    • 84874047848 scopus 로고    scopus 로고
    • Assuming an effective hole mass of m* = 0.5
    • Assuming an effective hole mass of m* = 0.5.
  • 29
    • 0034670761 scopus 로고    scopus 로고
    • 10.1103/PhysRevB.62.15851
    • A. D. Andreev and E. P. OReilly, Phys. Rev. B 62, 15851 (2000). 10.1103/PhysRevB.62.15851
    • (2000) Phys. Rev. B , vol.62 , pp. 15851
    • Andreev, A.D.1    Oreilly, E.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.