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Volumn 22, Issue 4, 2011, Pages 612-623

IonCCD™ for direct position-sensitive charged-particle detection: From electrons and keV ions to hyperthermal biomolecular ions

Author keywords

Beam profiling; Charged particle detection; Double focusing sector field; Hyper thermal ions; IonCCD; Micro array deposition; Nonscanning mass spectrometry; Pixelated detector; Simultaneous mixture separation

Indexed keywords

BEAM PROFILING; CHARGED PARTICLE DETECTION; DOUBLE FOCUSING; HYPER-THERMAL IONS; IONCCD; MICRO-ARRAY DEPOSITION; NONSCANNING MASS SPECTROMETRY; PIXELATED DETECTORS; SIMULTANEOUS MIXTURE SEPARATION;

EID: 79955785893     PISSN: 10440305     EISSN: 18791123     Source Type: Journal    
DOI: 10.1007/s13361-010-0067-7     Document Type: Article
Times cited : (34)

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