The influence of substrate temperature on the structure, morphology, and optical properties of ZrO2 thin films prepared by e-beam evaporation

Advanced Materials Letters

Volumn 3, Issue 5, 2012, Pages 410-414

  Patel, K J ^a   Desai, M S ^a   Panchal, C J ^a  

^a M S UNIVERSITY OF BARODA   (India)

Author keywords

Atomic force microscope; e beam evaporation method; Optical properties; Substrate temperature; X ray diffraction; Zirconium dioxide thin film

Indexed keywords

EID: 84873872343     PISSN: 09763961     EISSN: 0976397X     Source Type: Journal    
DOI: 10.5185/amlett.2012.5364     Document Type: Article

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