Effects of annealing temperature on the structural and photoluminescence properties of nanocrystalline ZrO2 thin films prepared by solgel route

Journal of Physics and Chemistry of Solids

Volumn 72, Issue 6, 2011, Pages 673-677

  Joy, K ^a   Berlin, I John ^a   Nair, Prabitha B ^a   Lakshmi, J S ^a   Daniel, Georgi P ^a   Thomas, P V ^a  

^a MAR IVANIOS COLLEGE   (India)

Author keywords

Defects; Luminescence; Solgel; Thin films; X ray diffraction

Indexed keywords

ANNEALING TEMPERATURES; BLUE SHIFT; BROAD BANDS; CRYSTALLINITIES; DEFECT STATE; ENERGY TRANSFER PROCESS; EXCITATION PEAKS; FT-IR SPECTRUM; INTENSE BANDS; LATTICE DISTORTIONS; NANOCRYSTALLINE ZIRCONIA; NANOCRYSTALLINES; NON-RADIATIVE; OH GROUP; OXYGEN CONTENT; PHOTOLUMINESCENCE PROPERTIES; PHOTOLUMINESCENCE SPECTRUM; PL INTENSITY; PL SPECTRA; RED SHIFT; SOL-GEL DIP COATING TECHNIQUE; SOL-GEL ROUTES; TEMPERATURE INCREASE; TETRAGONAL PHASE; TRANSMITTANCE SPECTRA; XRD PATTERNS;

ANNEALING; DEFECTS; ENERGY TRANSFER; FUNCTIONAL GROUPS; NANOCRYSTALLINE POWDERS; OXYGEN; PHOTOLUMINESCENCE; THIN FILMS; X RAY DIFFRACTION; ZIRCONIA; ZIRCONIUM ALLOYS;

FILM PREPARATION;

EID: 79956156080     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jpcs.2011.02.012     Document Type: Article

References (41)

1. L.A. Peyser, A.E. Vinson, A.P. Bartko, and R.M. Dickson Science 291 2001 103
2. Liping Liang, Yao Xu, Dong Wu, and Yuhan Sun Mater. Chem. Phys. 114 2009 252
3. G.R. Karagedov, and N.Z. Lyakhov Nanostruct. Mater. 11 1999 559
4. R.C. Patil, S. Radhakrishnan, Sushama Pethkar, and K. Vijaymohanan J. Mater. Res. 16 2001 7
5. M.S. Wang, and J.Y. Ying Chem. Mater. 10 1998 2067
6. M. Mamak, N. Coombs, and G. Ozin J. Am. Ceram. Soc. 122 2000 8923
7. Fransisco Trivinho-Strixino, Francisco E.U. Guimaraes, and Ernesto C. Pereira Chem. Phys. Lett. 461 2008 8
8. D.E. Harrison, N.T. Meamed, and E.C. Subbarao J. Electrochem. Soc. 110 1963 23
9. W.C. Hsieh, and C.S. Su J. Phys. D. Appl. Phys. 27 1994 1763
10. Z. Wang, B. Yang, Z. Fu, W. Dong, Y. Yang, and W. Liu Appl. Phys. A 81 2005 691 694
11. Lee-Jene Lai, Hsiao-Chi Lu, Hong-Kai Chen, Bing-Ming Cheng, Meng-I Lin, and Tieh-Chi Chu J. Electron Spectrosc. Relat. Phenom. 14447 2005 865
12. G. Cabello, L. Lillo, C. Caro, G.E. Buono-Core, B. Chornik, and M.A. Soto J. Non-cryst. Solids 354 2008 3919
13. K. Yamada, T.V. Chow, T. Horihata, and M. Nagata J. Non-Cryst. Solids 100 1988 316
14. M. Anast, B. Ben Nisan, J.R. Bartlett, L. Spiccia, B.O. West, G.R. Johnston, and I.D. Warkins Science and Technologia of Zirconia V.S.P.S. Badwal, M.J. Bannister, R.H.J. Hanmink, 1993 Technomic Publishing Company Inc. Lencaster, P.A. 259
15. M.A.C.G. Van de graaff, and A.J. Burg graaf A.H. Heuer, L.W. Hobbs., Advances in Ceramics vol. 3 1981 American Ceramic Society Columbia, Ohio 744
16. Chihiro Sakurai, Toshimi Fukui, and Manahiko Ockyama J. Am. Ceram. Bull. 70 1991 673
17. A. Diaz-Parralejo, R. Caruso, A.L. Ortiz, and F. Guiberteau Thin Solid Films 458 2004 92
18. Arup K. Atta, Prasanta K. Biswas, and D. Ganguli Thin Solid Films 197 1991
19. A. Srivasta, and M. Dougase Mater. Lett. 3 1987 111
20. B.D. Cullity, and S.R. Stock Elements of X-ray diffraction 3rd ed. 2001 Prentice Hall Upper Saddle river, NJ p. 388
21. S. Maniv, W.D. Westwood, and E.J. Colombini Vac. Sci. Technol. 20 2 1982 162
22. T. Hirata, E. Assari, and M. Kitajima J. Solid State Chem. 110 1994 201
23. A. Ortiz, J.C. Alonso, and E. Haro-Poniatowski J. Electron. Mater. 34 2005 150
24. Kenji Wada, Akihiko Nukui, Shinji Hirai, Kazuyoshishimakaze, and Motoi Sekizuchi J. Am. Ceram. Soc. 82 1999 2011
25. S. Zhao, F. Ma, K.W. Xu, and H.F. Liang J. Alloys Compd. 453 2008 453
26. R. Swanepoel J. Phys. E. Sci. Instrum. 16 1983 1214
27. I. Chambouleyron, J.M. Martinez, A.C. Morelti, and M. Mulato Appl. Opt. 36 1997 8238
28. Monjoy Sreemany, Ankita Bose, and Suchitra Sen Physica B 405 2010 85 93
29. Antonino Gulino, Giuseppe Compagnini, Russell G. Egdell, and Ignazio FragalaÁ Thin Solid Films 352 1999 73 76
30. Sumei Wang, Guodong Xia, Xicoyong Fu, Hongbo He, Jianda Shao, and Zhengxiu Fan Thin Solid Films 515 2007 3352
31. A.S. Foster, V.B. Sulimov, F. Lopez Gejo, A.L. Schluger, and R.M. Nieminen Phys. Rev. B 64 2001 224108
32. J. Liopis Phys. Status Solidi A 119 1990 661
33. P.A. Arsenev, Kh.S. Bagdasarov, A. Niklas, and A.D. Rhyazantsev Phys. Status Solidi A 62 1980 395
34. C.S.S.R. Kumar Noanomateriald-Toxicity, Health and Environmental Issues 2006 Wiley-VCH Weinhem
35. S. Batygov, V. Vashenko, S. Kudryavtsev, I. Klimkovich, and E. Lomonova Sov.Phys. Solid State 30 1988 378
36. A.V. Emeline, G.V. Kataeva, A.S. Litke, A.V. Rudokova, V.K. Ryabchuk, and N. Serpone Lanmuir 14 1998 5011
37. I.M. Bluvshtein, G.P. Nizhnikova, and O.V. Farberovich Sov. Phys. Solid State 32 1990 548
38. Y. Yan, A.J. Faber, and H. de Waal J Non-cryst. Solids 181 1995 283
39. R.J. Hong, J.B. Huang, H.B. He, Z.X. Fan, and J.D. Shao Appl. Surf. Sci. 242 2005 346 352
40. M.L. Cuia, X.M. Wu,-, L.J. Zhuge, and Y.D. Meng Vacuum 81 2007 899 903
41. Marco Kirm, Jaan Aarik, Meelis Jürgens, and Ilmo Sildos Nucl. Instrum. Methods Phys. Res. A 537 2005 251 255