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Volumn 81, Issue 11-12, 2007, Pages 1484-1488

Optical and structural study of EB-PVD ZrO2 thin films

Author keywords

EB PVD zirconia thin films

Indexed keywords

CRYSTALLITE SIZE; DEPOSITION; ELECTRON BEAMS; PHYSICAL VAPOR DEPOSITION; REFRACTIVE INDEX; YTTRIA STABILIZED ZIRCONIA;

EID: 34547873156     PISSN: 0042207X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.vacuum.2007.04.015     Document Type: Article
Times cited : (19)

References (23)
  • 8
    • 34547870377 scopus 로고    scopus 로고
    • Rigney DV, Viguie R, Wortman DJ. NASA conference publication 3312, 1995; 135pp.
  • 20
    • 0003691078 scopus 로고
    • Glocker D.A., and Shah S.I. (Eds), IOP Publishing Ltd., London Technical data in "Coating Materials, Sputtering Materials and Evaporation Sources", (Balzers AG, Liechtenstein, 1990).
    • Graper E.B. In: Glocker D.A., and Shah S.I. (Eds). Handbook of thin film process technology (1995), IOP Publishing Ltd., London Technical data in "Coating Materials, Sputtering Materials and Evaporation Sources", (Balzers AG, Liechtenstein, 1990).
    • (1995) Handbook of thin film process technology
    • Graper, E.B.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.