Fabrication and characterization of a diluted magnetic semiconducting TM co-doped Al:ZnO (TM = Co, Ni) thin films by sol-gel spin coating method

Spectrochimica Acta - Part A: Molecular and Biomolecular Spectroscopy

Volumn 106, Issue , 2013, Pages 118-123

  Siddheswaran, R ^a   Mangalaraja, R V ^a   Tijerina, Eduardo P ^b   Menchaca, J Luis ^b   Melendrez M F ^a   Avila, Ricardo E ^c   Esther Jeyanthi, C ^d   Gomez, M E ^e  

^a UNIVERSITY OF CONCEPCIÓN   (Chile)

^b UNIVERSIDAD AUTÓNOMA DE NUEVO LEÓN   (Mexico)

^c Chilean Nuclear Energy Commission   (Chile)

^d BHARATHIAR UNIVERSITY   (India)

^e UNIVERSIDAD DEL VALLE   (Colombia)

Author keywords

Diluted magnetic semiconductor; Ferromagnetism; Microstructure; Raman spectra; Thin films

Indexed keywords

DILUTED MAGNETIC SEMICONDUCTORS; ENERGY DISPERSIVE X-RAY; FABRICATION AND CHARACTERIZATIONS; MAGNETIC PROPERTIES OF NANOSTRUCTURES; SOL-GEL SPIN COATING; SOL-GEL SPIN COATING METHOD; STOICHIOMETRIC COMPOSITIONS; TRANSITION-METAL OXIDES;

ATOMIC FORCE MICROSCOPY; COATINGS; CRYSTAL DEFECTS; FABRICATION; FERROMAGNETISM; GRAIN GROWTH; MAGNETIC SEMICONDUCTORS; METALLIC FILMS; MICROSTRUCTURE; NICKEL; OPTICAL FILMS; RAMAN SCATTERING; SCANNING ELECTRON MICROSCOPY; SOL-GEL PROCESS; SOL-GELS; SPECTROSCOPIC ANALYSIS; SURFACE ROUGHNESS; THIN FILMS; X RAY SPECTROSCOPY; ZINC OXIDE; ZINC SULFIDE;

ALUMINUM;

ALUMINUM; COBALT; NANOMATERIAL; NICKEL; ZINC OXIDE;

ARTICLE; CHEMISTRY; CRYSTALLIZATION; MAGNET; PHASE TRANSITION; RAMAN SPECTROMETRY; SEMICONDUCTOR; SURFACE PROPERTY; ULTRASTRUCTURE; X RAY DIFFRACTION;

ALUMINUM; COBALT; CRYSTALLIZATION; MAGNETS; NANOSTRUCTURES; NICKEL; PHASE TRANSITION; SEMICONDUCTORS; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES; X-RAY DIFFRACTION; ZINC OXIDE;

EID: 84873426287     PISSN: 13861425     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.saa.2013.01.017     Document Type: Article

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