Comprehensive investigation of structural, electrical, and optical properties for ZnO:Al films deposited at different substrate temperature and oxygen ambient

Journal of Applied Physics

Volumn 103, Issue 7, 2008, Pages

  Dong, Bin Zhong ^a,b   Hu, Hao ^a,b   Fang, Guo Jia ^a,b   Zhao, Xing Zhong ^a,b   Zheng, Da Yu ^c   Sun, Yuan Ping ^c  

^a WUHAN UNIVERSITY   (China)

^b INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

^c YANTAI UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

FILM GROWTH; OPTICAL BAND GAPS; PHOTOLUMINESCENCE; POLYCRYSTALLINE MATERIALS; PULSED LASER DEPOSITION; SUBSTRATES; VALENCE BANDS; ZINC OXIDE;

CRYSTALLINE QUALITIES; INFRARED TRANSPARENCY LIMIT SHIFT;

THIN FILMS;

EID: 42149140608     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2901024     Document Type: Article

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