Effect of thickness on structural, electrical, optical and magnetic properties of Co and Al doped ZnO films deposited by sol-gel route

Applied Surface Science

Volumn 255, Issue 5 PART 1, 2008, Pages 2527-2532

  Sharma, Mamta ^a   Mehra, R M ^a  

^a UNIVERSITY OF DELHI   (India)

Author keywords

DMS; Growth; Sol gel; Thickness; Transparent spintronics

Indexed keywords

ALUMINUM; ATOMIC FORCE MICROSCOPY; COBALT; FILM GROWTH; GROWTH (MATERIALS); II-VI SEMICONDUCTORS; MAGNETIC PROPERTIES; SEMICONDUCTOR DOPING; SOL-GELS; THICK FILMS; X RAY DIFFRACTION; ZINC OXIDE;

AL-DOPED ZNO FILMS; C-AXIS ORIENTATIONS; CRYSTALLINITIES; MAGNETIC PROPERTIES OF CO; THICKNESS; THICKNESS OF THE FILM; TRANSPARENT SPINTRONICS; VISIBLE REGION;

SOL-GEL PROCESS;

EID: 56949089991     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.07.153     Document Type: Article

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