Synthesis and characterization of Ni-doped ZnO: A transparent magnetic semiconductor

Journal of Magnetism and Magnetic Materials

Volumn 320, Issue 24, 2008, Pages 3347-3351

  Pandey, B ^a   Ghosh, S ^a   Srivastava, P ^a   Avasthi, D K ^b   Kabiraj, D ^b   Pivin, J C ^c  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^b INTER UNIVERSITY ACCELERATOR CENTRE   (India)

^c CENTRE DE CALCUL DE L INSTITUT NATIONAL DE PHYSIQUE NUCLEAIRE ET DE PHYSIQUE DES PARTICULES   (France)

Author keywords

Grazing angle X ray diffraction; High resolution transmission electron microscopy; Magnetic property; Transparent magnetic semiconductor

Indexed keywords

CONCENTRATION (PROCESS); ELECTRIC CONDUCTIVITY; MAGNETIC MATERIALS; MAGNETIC SEMICONDUCTORS; MAGNETOMETERS; NICKEL; NICKEL ALLOYS; NICKEL OXIDE; OXIDE FILMS; OXIDES; SEMICONDUCTOR MATERIALS; THICK FILMS; ZINC; ZINC ALLOYS; ZINC OXIDE;

GRAZING ANGLE X-RAY DIFFRACTION; HIGH-RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNETIC PROPERTY; TRANSPARENT MAGNETIC SEMICONDUCTOR;

SEMICONDUCTING ZINC COMPOUNDS;

EID: 53749083943     PISSN: 03048853     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jmmm.2008.07.018     Document Type: Article

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