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Applied Physics Letters

Volumn 102, Issue 3, 2013, Pages

Depth-resolved cathodoluminescence spectroscopy of silicon supersaturated with sulfur

(6) Fabbri, Filippo a,b Smith, Matthew J b Recht, Daniel c Aziz, Michael J c Gradečak, Silvija b Salviati, Giancarlo a

a IMEM CNR (Italy)

b Massachusetts Institute of Technology Cambridge (United States)

c HARVARD UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CATHODOLUMINESCENCE SPECTROSCOPY; DEFECT BANDS; DEPTH-RESOLVED; LUMINESCENCE QUENCHING; ORDERS OF MAGNITUDE; SECONDARY ION MASS SPECTROSCOPY; SINGLE-CRYSTALLINE; STRONG LUMINESCENCE;

CATHODOLUMINESCENCE; SECONDARY ION MASS SPECTROMETRY; SULFUR;

SILICON;

EID: 84872980191 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4788743 Document Type: Article

Times cited : (13)

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