Nanometer-range strain distribution in layered incommensurate systems

Physical Review Letters

Volumn 109, Issue 26, 2012, Pages

  Stetsovych, Oleksandr ^a   Dvořák, Filip ^a   Szabová, Lucie ^a   Fabris, Stefano ^b,c   Mysliveček, Josef ^a   Matolín, Vladimír ^a  

^a CHARLES UNIVERSITY   (Czech Republic)

^b IOM CNR LABORATORIO TASC   (Italy)

^c SISSA   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CU SUBSTRATE; CU(1 1 1); FRINGE COUNTING; INCOMMENSURATE SYSTEMS; LAYERED SYSTEMS; NANOMETER-SCALE RESOLUTION; SINGLE CRYSTALLINE SUBSTRATES; STRAIN DISTRIBUTIONS; STRAINED THIN FILMS;

CERIUM COMPOUNDS; EPITAXIAL GROWTH; GRAPHENE; SCANNING TUNNELING MICROSCOPY; SUBSTRATES;

COPPER;

EID: 84871793042     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.109.266102     Document Type: Article

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