SCOPUS 정보 검색 플랫폼

Volumn 600, Issue 5, 2006, Pages 1099-1106

Strain relaxation and surface morphology of nickel oxide nanolayers

(7) Schoiswohl, J a Zheng, W a Surnev, S a Ramsey, M G a Granozzi, G b Agnoli, S b Netzer, F P a

Author keywords

Epitaxial thin films; Growth; High resolution LEED (HR LEED, SPA LEED); Morphology; Nickel oxides; Oxide nanolayer; Palladium (1 0 0); Scanning tunneling microscopy (STM)

Indexed keywords

ANISOTROPY; LATTICE CONSTANTS; LOW ENERGY ELECTRON DIFFRACTION; NANOSTRUCTURED MATERIALS; PALLADIUM; SCANNING TUNNELING MICROSCOPY;

HIGH-RESOLUTION LEED (HR-LEED, SPA-LEED); OXIDE MONOLAYER; PALLADIUM(1 0 0);

NICKEL COMPOUNDS;

EID: 33644594622 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/j.susc.2005.12.038 Document Type: Article

Times cited : (31)

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