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Volumn 84, Issue 23, 2011, Pages

Silicate-free growth of high-quality ultrathin cerium oxide films on Si(111)

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EID: 84855383115     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.235418     Document Type: Article
Times cited : (26)

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