Large-area compositional mapping of Cu(In1-xGa x)Se2 materials and devices with spectroscopic ellipsometry

IEEE Journal of Photovoltaics

Volumn 3, Issue 1, 2013, Pages 359-363

  Aryal, Puruswottam ^a   Attygalle, Dinesh ^a   Pradhan, Puja ^a   Podraza, Nikolas J ^a   Marsillac, Sylvain ^b   Collins, Robert W ^a  

^a UNIVERSITY OF TOLEDO   (United States)

^b Old Dominion University   (United States)

Author keywords

Ellipsometry; gallium based semiconductor materials; optical variables measurement; photovoltaic (PV) cells; semiconductor film; thickness measurement

Indexed keywords

ALLOY COMPOSITIONS; CIGS FILMS; COMPLEX DIELECTRIC FUNCTIONS; COMPOSITIONAL MAPPING; COPPER INDIUM GALLIUM DISELENIDE; ENERGY DISPERSIVE X-RAY; FITTING PARAMETERS; GA CONTENT; MAPPING CAPABILITIES; OSCILLATOR PARAMETERS; PARAMETER CORRELATION; PARAMETERIZED; PHOTOVOLTAIC; SEMICONDUCTOR FILMS; SINGLE PARAMETER;

COPPER; COPPER COMPOUNDS; ELLIPSOMETRY; MAPPING; OPTICAL VARIABLES MEASUREMENT; SELENIUM COMPOUNDS; SEMICONDUCTING SELENIUM COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; STOICHIOMETRY; SURFACE ROUGHNESS; THICKNESS MEASUREMENT;

GALLIUM;

EID: 84871729610     PISSN: 21563381     EISSN: None     Source Type: Journal    
DOI: 10.1109/JPHOTOV.2012.2216513     Document Type: Article

References (21)

1. M. A. Green, K. Emery, Y. Hishikawa, W. Warta, and E. D. Dunlop, "Solar cell efficiency tables (version 39)," Prog. Photovolt., vol. 20, pp. 12-20, 2012.
2. P. Jackson, D. Hariskos, E. Lotter, S. Paetel, R. Wuerz, R. Menner, W. Wischmann, and M. Powalla, "New world record efficiency for Cu(In, Ga)Se2 thin-film solar cells beyond 20%," Prog. Photovolt.: Res. Appl., vol. 19, pp. 894-897, 2011.
3. I. Repins, M. A. Contreras, B. Egaas, C. DeHart, J. Scharf, C. L. Perkins, B. To, and R. Noufi, "19. 9%-efficient ZnO/CdS/CuInGaSe2 solar cell with 81. 2% fill factor," Prog. Photovolt.: Res. Appl., vol. 16, pp. 235-239, 2008. (Pubitemid 351547754)
4. K. Ramanathan, M. A. Contreras, C. L. Perkins, S. Asher, F. S. Hasoon, J. Keane, D. Young, M. Romero, W. Metzger, R. Noufi, J. Ward, and A. Duda, "Properties of 19. 2% efficiency ZnO/CdS/CuInGaSe2 thin-film solar cells," Prog. Photovolt.: Res. Appl., vol. 11, pp. 225-230, 2003. (Pubitemid 36756903)
5. W. Li, S. R. Cohen, K. Gartsman, and D. Cahen, "Ga composition dictates macroscopic photovoltaic and nanoscopic electrical characteristics of Cu(In1-x Gax )Se2 thin films via grain-boundary-type inversion," IEEE J. Photovolt., vol. 2, no. 2, pp. 191-195, 2012.
6. W. N. Shafarman, R. Klenk, and B. E. McCandless, "Device and material characterization of Cu(InGa)Se2 solar cells with increasing band gap," J. Appl. Phys., vol. 79, pp. 7324-7328, 1996. (Pubitemid 126628962)
7. S. H. Han, F. S. Hasoon, H. A. Al-Thani, A. M. Hermann, and D. H. Levi, "Effect of Cu deficiency on the optical properties and electronic structure of CuIn1-x Gax Se2," J. Phys. Chem. Solids, vol. 66, pp. 1895-1898, 2005. (Pubitemid 41795730)
8. S. Wiedeman, S. Albright, J. S. Britt, U. Schoop, S. Schuler, W. Stoss, and D. Verebelyi, "Manufacturing ramp-up of flexible CIGS PV," in Proc. 35th IEEE Photovoltaics Spec. Conf., Honolulu, HI, Jun. 20-25, 2010, pp. 3485-3490.
9. D. Abou-Ras et al., "Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films," Microsc. Microanal., vol. 17, pp. 728-751, 2011.
10. I. L. Eisgruber, B. Joshi, N. Gomez, J. Britt, and T. Vincent, "In situ Xray fluorescence used for real-time control of CuInx Ga1?xSe2 thin film composition," Thin Solid Films, vol. 408, pp. 64-72, 2002. (Pubitemid 34449081)
11. M. Klenk, O. Schenker, U. Probst, and E. Bucher, "X-ray fluorescence measurements of thin film chalcopyrite solar cells," Sol. Energy Mater. Sol. Cells, vol. 58, pp. 299-319, 1999.
12. J. Li, J. Chen, M. N. Sestak, C. Thornberry, and R. W. Collins, "Spectroscopic ellipsometry studies of thin film CdTe and CdS: from dielectric functions to solar cell structures," in Proc. 34th IEEE Photovolt. Spec. Conf., Philadelphia, PA, Jun. 7-12, 2009, pp. 1783-1788.
13. P. Aryal, J. Chen, Z. Huang, L. R. Dahal, M. N. Sestak, D. Attygalle, R. Jacobs, V. Ranjan, S. Marsillac, and R. W. Collins, "Quantum efficiency simulations from on-line compatible mapping of thin-film solar cells," in Proc. 37th IEEE Photovolt. Spec. Conf., Seattle, WA, Jun. 19-24, 2011, pp. 2241-2246.
14. R. W. Collins, I. An, J. Lee, and J. A. Zapien, "Multichannel ellipsometry," in Handbook of Ellipsometry, H. G. Tompkins and E. A. Irene, Eds. Norwich, NY: William Andrew, 2005, pp. 481-566.
15. M. Fried, G. Juhasz, C. Major, A. Nemeth, P. Petrik, O. Polgar, C. Salupo, L. R. Dahal, and R. W. Collins, "Application of a dual-spectralrange, expanded-beam spectroscopic ellipsometer for mapping largearea, laterally-inhomogeneous, photovoltaic multilayers," MRS Proc., vol. 1323, C03-12, 2011, doi:10. 1557/opl. 2011. 820.
16. A. S. Ferlauto, G. M. Ferreira, J. M. Pearce, C. R. Wronski, R. W. Collins, X. M. Deng, and G. Ganguly, "Analytical model for the optical functions of amorphous semiconductors from the near-infrared to ultraviolet: Applications in thin film photovoltaics," J. Appl. Phys., vol. 92, pp. 2424-2436, 2002.
17. B. Johs and J. S. Hale, "Dielectric function representation by B-splines," Phys. Status Solidi (a), vol. 205, pp. 715-719, 2008.
18. P. D. Paulson, R. W. Birkmire, and W. N. Shafarman, "Optical characterization of CuIn1-x Gax Se2 alloy thin films by spectroscopic ellipsometry," J. Appl. Phys., vol. 94, pp. 879-888, 2003.
19. S. Marsillac, V. Ranjan, S. Little, and R. W. Collins, "In-situ study of CIGS dielectric function as a function of copper content," in Proc. 35th IEEE Photovolt. Spec. Conf., Honolulu, HI, Jun. 20-25, 2010, pp. 866-868.
20. V. Ranjan, R. W. Collins, and S. Marsillac, "Real-time analysis of the microstructural evolution and optical properties of Cu(In, Ga)Se2 thin films as a function of Cu content," Phys. Status Solidi-Rapid Res. Lett., vol. 6, pp. 10-12, 2012.
21. R. W. Collins and A. S. Ferlauto, "Optical physics of materials," in Handbook of Ellipsometry, H. G. Tompkins and E. A. Irene, Eds. Norwich, NY: William Andrew, 2005, pp. 181-184.