Real-time analysis of the microstructural evolution and optical properties of Cu(In,Ga)Se 2 thin films as a function of Cu content

Physica Status Solidi - Rapid Research Letters

Volumn 6, Issue 1, 2012, Pages 10-12

  Ranjan, Vikash ^a   Collins, R W ^b   Marsillac, Sylvain ^a  

^a Old Dominion University   (United States)

^b UNIVERSITY OF TOLEDO   (United States)

Author keywords

Cu(In,Ga)Se 2; Dielectric functions; Microstructures; Real time spectroscopic ellipsometry

Indexed keywords

CO-EVAPORATIONS; COPPER CONTENT; CRITICAL POINTS; CU CONTENT; CU(IN , GA)SE; CU-POOR; CU-RICH FILMS; DIELECTRIC FUNCTIONS; GRAIN SIZE; REAL TIME ANALYSIS; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; SUBBAND GAP ABSORPTION; THERMALLY OXIDIZED SILICON;

COALESCENCE; GALLIUM; GALLIUM ALLOYS; MICROSTRUCTURE; OPTICAL PROPERTIES; SEMICONDUCTING SELENIUM COMPOUNDS; SILICON OXIDES; SPECTROSCOPIC ELLIPSOMETRY; THIN FILMS;

COPPER;

EID: 83455225252     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.201105385     Document Type: Article

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