IN-situ study of CIGS dielectric function as a function of copper content

Conference Record of the IEEE Photovoltaic Specialists Conference

Volumn , Issue , 2010, Pages 866-868

  Marsillac, S ^a   Ranjan, V ^a   Little, S ^a   Collins, R W ^a  

^a UNIVERSITY OF TOLEDO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORBER LAYERS; CO-EVAPORATIONS; COPPER CONTENT; CU-POOR; DIELECTRIC FUNCTIONS; ENDPOINT DETECTION; HIGH EFFICIENCY; HIGH SENSITIVITY; IN-SITU STUDY; NON DESTRUCTIVE; PHASE CHANGE; REAL TIME SPECTROSCOPIC ELLIPSOMETRY; THERMAL RESPONSE; THIN FILM SOLAR CELLS; TWO STAGE;

ELECTRONIC PROPERTIES; GALLIUM; PHASE TRANSITIONS; PHOTOVOLTAIC EFFECTS; SEMICONDUCTING SELENIUM COMPOUNDS; SPECTROSCOPIC ELLIPSOMETRY; THERMOCOUPLES;

COPPER;

EID: 78650142694     PISSN: 01608371     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PVSC.2010.5617166     Document Type: Conference Paper

References (5)

1. 2 films using end-point detection" Thin Solid Films 480-481, 2005, pp. 61- 66.
2. 2 alloys", Appl. Phys. A: Mater. Sci. Process. 74, 2002, pp. 659-664.
3. I. An, Y. M. Li, H. V. Nguyen, C. R. Wronski, and R. W. Collins, "In situ determination of dielectric functions and optical gap of ultrathin amorphous silicon by real time spectroscopic ellipsometry" Appl. Phys. Lett. 59, 1991, pp. 2543-2545.
4. H.V. Nguyen, I. An, and R.w. Collins, "Evolution of the optical functions of thin-film aluminum: A real-time spectroscopic ellipsometry study" Phys. Rev. B 47, 1993, pp. 3947-3965.
5. H.W. Schock, "Properties of Chalcopyrite-Based Materials and Film Deposition for Thin-Film Solar Cells." Ed. by Y. Hamakawa, Thin-Films Solar Cells: Next Generation Photovoltaics and Its Applications, Springer, 2004, pp.163-182.