Comprehensive comparison of various techniques for the analysis of elemental distributions in thin films

Microscopy and Microanalysis

Volumn 17, Issue 5, 2011, Pages 728-751

  Abou Ras, D ^a   Caballero, R ^a   Fischer, C H ^a   Kaufmann, C A ^a   Lauermann, I ^a   Mainz, R ^a   Monig H ^a   Schopke A ^a   Stephan, C ^a   Streeck, C ^a   Schorr, S ^b   Eicke, A ^c   Dobeli M ^d   Gade, B ^e   Hinrichs, J ^e   Nunney, T ^f   Dijkstra, H ^f   Hoffmann, V ^g   Klemm, D ^g   Efimova, V ^g   Bergmaier, A ^h   Dollinger, G ^h   Wirth, T ⁱ   Unger, W ⁱ   Rockett, A A ^j   Perez Rodriguez, A ^k,l   Alvarez Garcia, J ^m   Izquierdo Roca, V ^l   Schmid, T ^d   Choi, P P ⁿ   Muller M ^o   Bertram, F ^o   Christen, J ^o   Khatri, H ^p   Collins, R W ^p   Marsillac, S ^p   Kotschau I ^q   more..

^a HAHN MEITNER INSTITUT   (Germany)

^b FREIE UNIVERSITÄT BERLIN   (Germany)

^c ZENTRUM FÜR SONNENENERGIE UND WASSERSTOFF FORSCHUNG BADEN WÜRTTEMBERG ZSW   (Germany)

^d ETH ZURICH   (Switzerland)

^e THERMO FISHER SCIENTIFIC   (Germany)

^f Thermo Fisher Scientific   (United States)

^g IFW DRESDEN   (Germany)

^h BUNDESWEHR UNIVERSITY MUNICH   (Germany)

ⁱ BAM FEDERAL INSTITUTE FOR MATERIALS RESEARCH AND TESTING   (Germany)

^j University of Illinois at Urbana Champaign   (United States)

^k CATALONIA INSTITUTE FOR ENERGY RESEARCH IREC   (Spain)

^l UNIVERSITY OF BARCELONA   (Spain)

^m Centre de Recerca i Investigacio de Catalunya CRIC   (Spain)

ⁿ MAX PLANCK INSTITUT FÜR EISENFORSCHUNG GMBH   (Germany)

^o OTTO VON GUERICKE UNIVERSITY   (Germany)

^p UNIVERSITY OF TOLEDO   (United States)

^q CENTROTHERM PHOTOVOLTAICS AG   (Germany)

more..

Author keywords

chalcopyrite type; chemical mapping; comparison; Cu(In,Ga)Se2; depth profiling; elemental distributions; solar cells; thin films

Indexed keywords

EID: 80054878532     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927611000523     Document Type: Article

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