Real-time soft-error testing results of 45-nm, high-k metal gate, bulk CMOS SRAMs

IEEE Transactions on Nuclear Science

Volumn 59, Issue 6, 2012, Pages 2818-2823

  Seifert, Norbert ^a   Kirsch, Matthew ^a  

^a INTEL CORPORATION   (United States)

Author keywords

Alpha particles; life testing; neutrons; radiation; real time testing; single event; single event effect (SEE); soft error; soft error rate (SER)

Indexed keywords

ALPHA PARTICLES; ELECTRICAL ENGINEERING; HEAT RADIATION; NEUTRONS; NUCLEAR ENERGY;

LIFE-TESTING; REAL-TIME TESTING; SINGLE EVENT; SINGLE EVENT EFFECTS; SOFT ERROR; SOFT ERROR RATE;

METAL TESTING;

EID: 84871378876     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2012.2220858     Document Type: Article

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