Multicenter comparison of alpha particle measurements and methods typical of semiconductor processing

IEEE International Reliability Physics Symposium Proceedings

Volumn , Issue , 2011, Pages

  Wilkinson, Jeffrey D ^a   Clark, Brett M ^b   Wong, Richard ^c   Slayman, Charles ^d   Carroll, Barry ^e   Gordon, Michael ^f   He, Yi ^g   Lauzeral, Olivier ^h   Lepla, Keith ⁱ   Marckmann, Jennifer ^j   McNally, Brendan ^k   Roche, Philippe ^l   Tucker, Mike ^m   Wu, Tommy ⁿ  

^a MEDTRONIC   (United States)

^b HONEYWELL   (United States)

^c CISCO SYSTEMS   (United States)

^d Ops A La Carte   (United States)

^e FREESCALE SEMICONDUCTOR INC   (United States)

^f IBM T J WATSON RESEARCH CENTER   (United States)

^g INTEL CORPORATION   (United States)

^h IRoC Technologies   (United States)

ⁱ Teck Metals Ltd   (United States)

^j Medtronic Tempe Campus ^*  (United States)

^k XIA LLC   (Taiwan)

^l STMICROELECTRONICS   (Italy)

^m Alpha Sciences Inc   (Taiwan)

ⁿ SGS Taiwan Ltd   (Taiwan)

more..

Author keywords

alpha particles; device packaging; semiconductor device reliability; soft errors

Indexed keywords

ALPHA EMISSIONS; DEVICE PACKAGING; LOW ALPHA; MEASUREMENT METHODS; PACKAGING APPLICATIONS; PARTICLE MEASUREMENT; REPLICATE MEASUREMENTS; ROUND ROBIN; SEMICONDUCTOR DEVICE RELIABILITY; SEMICONDUCTOR INDUSTRY; SEMICONDUCTOR PROCESSING; SEMICONDUCTOR PRODUCTION; SOFT ERROR; STANDARD DEVIATION; STRONG CORRELATION; SYSTEMATIC VARIATION;

ALPHA PARTICLES; CHIP SCALE PACKAGES; ELECTROMAGNETIC WAVE EMISSION; PACKAGING MATERIALS; RELIABILITY; SEMICONDUCTOR DEVICE MANUFACTURE;

UNCERTAINTY ANALYSIS;

EID: 79959325979     PISSN: 15417026     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IRPS.2011.5784521     Document Type: Conference Paper

References (8)

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5. Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices. JEDEC Standard. Arlington, VA, JEDEC: 94.
6. Clark, B. M. (2010). Personal communication.
7. Mistry, A., S. Lee, et al. (2000). Characterization of Low Alpha Emissivity System on Electroplated Solder Bumps. 2000 Electronic Components and Technology Conference.
8. Knoll, G. F. (2010). Radiation Detection and Measurement, John Wiley & Sons, Inc.