Altitude and underground real-time ser tests of embedded SRAM

Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS

Volumn , Issue , 2009, Pages 342-347

  Heijmen, Tino ^a   Verwijst, Joop ^a  

^a NXP SEMICONDUCTORS   (Netherlands)

Author keywords

Radiation effects; realtime SER test; soft error rate (SER)

Indexed keywords

CONFIDENCE LIMIT; EMBEDDED SRAM; EXPONENTIAL DISTRIBUTIONS; PROCESS TECHNOLOGIES; RADIATION-INDUCED; REAL TIME; SOFT ERROR; SOFT ERROR RATE; UPSET RATES;

CAVES; EMBEDDED SYSTEMS; NEUTRONS; RANDOM ERRORS; TESTING;

REAL TIME SYSTEMS;

EID: 80052764660     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RADECS.2009.5994673     Document Type: Conference Paper

References (10)

1. JEDEC Standard JESD89A, "Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray-Induced Soft Errors in Semiconductor Devices, Oct. 2006.
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8. H. Kobayashi, N. Kawamoto, J. Kase, and K. Shiraish, "Alpha Particle and Neutron-induced Soft Error Rates and Scaling Trends in SRAM", in Proc. Int'l Rel. Phys. Symp. (IRPS), Montreal, 2009, pp. 206-211.
9. Ph. Roche, ST Microelectronics, Crolles, France, private communication, Aug. 2009.
10. R. C. Baumann and D. Radaelli, "Determination of Geometry and Absorption Effects and Their Impact on the Accuracy of Alpha Particle Soft Error Rate Extrapolations", IEEE Trans. Nucl. Sci., vol. 54, no. 6, pp. 2141-2148, Dec. 2007.