Hafnium and uranium contributions to soft error rate at ground level

IEEE Transactions on Nuclear Science

Volumn 55, Issue 6, 2008, Pages 3141-3145

  Wrobel, Frédéric ^a   Gasiot, Jean ^a,b   Saigné, Frédéric ^a  

^a UNIV MONTPELLIER   (France)

^b VANDERBILT UNIVERSITY   (United States)

Author keywords

Alpha emitter; Contamination; Hafnium; Impurities; Neutrons; Pollutant; Radioactive materials; Radioactivity; Soft error rate; Uranium

Indexed keywords

ACTINIDES; ALPHA PARTICLES; ATOMS; ENERGY TRANSFER; IMPURITIES; LEAD; MONTE CARLO METHODS; NEUTRONS; RADIATION; RADIOACTIVE ELEMENTS; RADIOACTIVE MATERIALS; RADIOACTIVITY; SEMICONDUCTING SILICON COMPOUNDS; SILICON WAFERS; TRANSURANIUM ELEMENTS; URANIUM;

ALPHA EMITTER; CONTAMINATION; CURRENT TECHNOLOGIES; DISINTEGRATION RATES; GROUND LEVELS; HAFNIUM DIOXIDES; MODERN TECHNOLOGIES; MONTE CARLO SIMULATIONS; POLLUTANT; SOFT ERROR RATE; URANIUM CONCENTRATIONS;

HAFNIUM;

EID: 58849134233     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2005778     Document Type: Conference Paper

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