Large-scale analysis of high-speed atomic force microscopy data sets using adaptive image processing

Beilstein Journal of Nanotechnology

Volumn 3, Issue 1, 2012, Pages 747-758

  Erickson, Blake W ^a   Coquoz, Séverine ^a   Adams, Jonathan D ^a   Burns, Daniel J ^b   Fantner, Georg E ^a  

^a EPFL   (Switzerland)

^b Massachusetts Institute of Technology Cambridge   (United States)

Author keywords

Adaptive algorithm; Artifact correction; Atomic force microscopy; High Speed atomic force microscope; Image processing

Indexed keywords

ADAPTIVE IMAGE PROCESSING; AFM; AFM IMAGE; ARTIFACT CORRECTION; ATOMIC FORCE MICROSCOPE (AFM); DATA SETS; LARGE-SCALE ANALYSIS; PROCESSING ALGORITHMS; TOPOGRAPHIC FEATURES;

ADAPTIVE ALGORITHMS; ATOMIC FORCE MICROSCOPY; IMAGE PROCESSING; SEPARATION;

ITERATIVE METHODS;

EID: 84870475695     PISSN: None     EISSN: 21904286     Source Type: Journal    
DOI: 10.3762/bjnano.3.84     Document Type: Article

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