Automated line flattening of atomic force microscopy images

Proceedings - International Conference on Image Processing, ICIP

Volumn , Issue , 2008, Pages 2968-2971

  Tsaftaris, S A ^a   Zujovic, J ^a   Katsaggelos, A K ^a  

^a Northwestern University   (United States)

Author keywords

Curve fitting; Nanotechnology; Object detection; Polynomial approximation

Indexed keywords

AFM; ATOMIC FORCE; AUTOMATED ALGORITHMS; AUTOMATED LINES; BOWING EFFECT; DNA-WRAPPED CARBON NANOTUBES; HUMAN INTERVENTION; ITERATIVE FASHION; OBJECT DATA; OBJECT DETECTION; REAL IMAGES; SYNTHETIC EXPERIMENTS;

ALGORITHMS; ATOMIC FORCE MICROSCOPY; CARBON NANOTUBES; DNA; GENES; IMAGE PROCESSING; IMAGING SYSTEMS; NANOTECHNOLOGY; NUCLEIC ACIDS; POLYNOMIAL APPROXIMATION; SURFACE TOPOGRAPHY;

CURVE FITTING;

EID: 69949147094     PISSN: 15224880     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICIP.2008.4712418     Document Type: Conference Paper

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