Atomic force microscopy studies of surface contamination on stainless steel weights

Metrologia

Volumn 47, Issue 6, 2010, Pages 670-676

  Hogstrom R ^a   Korpelainen, V ^a   Riski, K ^a   Heinonen, M ^a  

^a CENTRE FOR METROLOGY AND ACCREDITATION MIKES   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION CHARACTERISTIC; AFM; AMBIENT PRESSURES; ATOMIC FORCE MICROSCOPES; BEFORE AND AFTER; HUMIDITY EFFECTS; IMAGE PROCESSING - METHODS; LONG TERM STABILITY; NANOMETRE RESOLUTION; NANOMETRES; STAINLESS STEEL WEIGHT; STANDARD WEIGHTS; SURFACE CONTAMINATIONS; SURFACE EFFECT; SURFACE MICROSTRUCTURES; TOPOGRAPHY IMAGES; UNIT OF MASS;

ADSORPTION; AIR CLEANERS; ATOMIC FORCE MICROSCOPY; CLEANING; CONTAMINATION; CORROSION RESISTANT ALLOYS; ETHANOL; IMAGE PROCESSING; METRIC SYSTEM; SCALES (WEIGHING INSTRUMENTS); SURFACE TOPOGRAPHY; ULTRASONIC CLEANING; VACUUM;

STAINLESS STEEL;

EID: 78650141007     PISSN: 00261394     EISSN: 16817575     Source Type: Journal    
DOI: 10.1088/0026-1394/47/6/006     Document Type: Article

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