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Journal of Materials Chemistry

Volumn 22, Issue 38, 2012, Pages 20742-20746

Fabrication of ZnO nano-structures using UV nanoimprint lithography of a ZnO nano-particle dispersion resin

(5) Jo, Han Byeol a Byeon, Kyeong Jae a Lee, Heon a Kwon, Moo Hyun b Choi, Kyung Woo c

a Korea University (South Korea)

b Woosuk University (South Korea)

c Korea Institute of Nuclear Safety (KINS) (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

IMPRINTED STRUCTURES; LOW REFRACTIVE INDEX; NANO-PARTICLE DISPERSIONS; PATTERNING TECHNOLOGY; RESIN STRUCTURES; SUBMICRON SCALE; UV NANOIMPRINT LITHOGRAPHY; ZINC OXIDE (ZNO); ZNO; ZNO NANOPARTICLES;

DISPERSIONS; LIGHT EMITTING DIODES; NANOIMPRINT LITHOGRAPHY; NANOPARTICLES; OPTICAL DEVICES; REFRACTIVE INDEX; RESINS;

ZINC OXIDE;

EID: 84870467076 PISSN: 09599428 EISSN: 13645501 Source Type: Journal
DOI: 10.1039/c2jm32509h Document Type: Article

Times cited : (27)

References (25)

1
- 34548431305
- K. J. Byeon S. Y. Hwang H. Lee Appl. Phys. Lett. 2007 91 091106
- (2007) Appl. Phys. Lett. , vol.91 , pp. 091106
- Byeon, K.J.¹ Hwang, S.Y.² Lee, H.³

2
- 72849152074
- K. Y. Yang K. M. Yoon S. W. Lim H. Lee J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct.-Process., Meas., Phenom. 2009 27 2786
- (2009) J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct.-Process., Meas., Phenom. , vol.27 , pp. 2786
- Yang, K.Y.¹ Yoon, K.M.² Lim, S.W.³ Lee, H.⁴

3
- 67349105702
- K. S. Han H. J. Lee D. H. Kim H. Lee Sol. Energy Mater. Sol. Cells 2009 93 1214
- (2009) Sol. Energy Mater. Sol. Cells , vol.93 , pp. 1214
- Han, K.S.¹ Lee, H.J.² Kim, D.H.³ Lee, H.⁴

4
- 79851503921
- C. Battaglia J. Escarré K. Söderström L. Erni L. Ding G. Bugnon A. Billet M. Boccard L. Barraud S. De Wolf F. J. Haug M. Despeisse C. Ballif Nano Lett. 2011 11 661
- (2011) Nano Lett. , vol.11 , pp. 661
- Battaglia, C.¹ Escarré, J.² Söderström, K.³ Erni, L.⁴ Ding, L.⁵ Bugnon, G.⁶ Billet, A.⁷ Boccard, M.⁸ Barraud, L.⁹ De Wolf, S.¹⁰ Haug, F.J.¹¹ Despeisse, M.¹² Ballif, C.¹³

5
- 84870450566
- J. H. Shin K. S. Han H. Lee Prog. Photovoltaics 2010 19 339
- (2010) Prog. Photovoltaics , vol.19 , pp. 339
- Shin, J.H.¹ Han, K.S.² Lee, H.³

6
- 77957713087
- K. Y. Yang S. C. Oh J. Y. Cho K. J. Byeon H. Lee J. Electrochem. Soc. 2010 157 1067
- (2010) J. Electrochem. Soc. , vol.157 , pp. 1067
- Yang, K.Y.¹ Oh, S.C.² Cho, J.Y.³ Byeon, K.J.⁴ Lee, H.⁵

7
- 80052210501
- J. Y. Park N. R. Hendricks K. R. Carter Langmuir 2011 27 11251
- (2011) Langmuir , vol.27 , pp. 11251
- Park, J.Y.¹ Hendricks, N.R.² Carter, K.R.³

8
- 77951607303
- W. Zhou G. Min Z. Song J. Zhang Y. Liu J. Zhang Nanotechnology 2010 21 205304
- (2010) Nanotechnology , vol.21 , pp. 205304
- Zhou, W.¹ Min, G.² Song, Z.³ Zhang, J.⁴ Liu, Y.⁵ Zhang, J.⁶

9
- 33947527279
- S. H. Kim K. D. Lee J. Y. Kim M. K. Kwon S. J. Park Nanotechnology 2007 18 055306
- (2007) Nanotechnology , vol.18 , pp. 055306
- Kim, S.H.¹ Lee, K.D.² Kim, J.Y.³ Kwon, M.K.⁴ Park, S.J.⁵

10
- 77951642236
- S. A. Boden D. M. Bagnall Prog. Photovoltaics 2010 18 195
- (2010) Prog. Photovoltaics , vol.18 , pp. 195
- Boden, S.A.¹ Bagnall, D.M.²

11
- 5344241941
- S. Y. Chou P. R. Krauss P. J. Renstrom J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct.-Process., Meas., Phenom. 1996 14 4129
- (1996) J. Vac. Sci. Technol., B: Microelectron. Nanometer Struct.-Process., Meas., Phenom. , vol.14 , pp. 4129
- Chou, S.Y.¹ Krauss, P.R.² Renstrom, P.J.³

12
- 0142037327
- S. Y. Chou P. R. Krauss P. J. Renstrom Appl. Phys. Lett. 1995 67 3114
- (1995) Appl. Phys. Lett. , vol.67 , pp. 3114
- Chou, S.Y.¹ Krauss, P.R.² Renstrom, P.J.³

13
- 34247620822
- S. H. Hong J. H. Lee H. Lee Microelectron. Eng. 2007 84 977
- (2007) Microelectron. Eng. , vol.84 , pp. 977
- Hong, S.H.¹ Lee, J.H.² Lee, H.³

14
- 34247627440
- K. J. Byeon K. Y. Yang H. Lee Microelectron. Eng. 2007 84 1003
- (2007) Microelectron. Eng. , vol.84 , pp. 1003
- Byeon, K.J.¹ Yang, K.Y.² Lee, H.³

15
- 3142660496
- J. H. Jeong Y. S. Sim H. Sohn E. S. Lee Microelectron. Eng. 2004 75 165
- (2004) Microelectron. Eng. , vol.75 , pp. 165
- Jeong, J.H.¹ Sim, Y.S.² Sohn, H.³ Lee, E.S.⁴

16
- 80053380350
- S. H. Lee K. J. Byeon H. W. Park J. Y. Cho K. Y. Yang H. Lee Microelectron. Eng. 2011 88 3278
- (2011) Microelectron. Eng. , vol.88 , pp. 3278
- Lee, S.H.¹ Byeon, K.J.² Park, H.W.³ Cho, J.Y.⁴ Yang, K.Y.⁵ Lee, H.⁶

17
- 0037418379
- Y. Xia P. Yang Y. Sun Y. Wu B. Mayers B. Gates Y. Yiin F. Kim H. Yan Adv. Mater. 2003 15 353
- (2003) Adv. Mater. , vol.15 , pp. 353
- Xia, Y.¹ Yang, P.² Sun, Y.³ Wu, Y.⁴ Mayers, B.⁵ Gates, B.⁶ Yiin, Y.⁷ Kim, F.⁸ Yan, H.⁹

18
- 84870469929
- J. A. Aranovich D. Golmayo A. L. Fechrenbruch R. H. Bube J. Appl. Phys. 1980 51 450
- (1980) J. Appl. Phys. , vol.51 , pp. 450
- Aranovich, J.A.¹ Golmayo, D.² Fechrenbruch, A.L.³ Bube, R.H.⁴

19
- 0033704990
- J. Q. Xu Y. Q. Pan Y. A. Shun Z. Z. Tian Sens. Actuators, B 2000 66 277
- (2000) Sens. Actuators, B , vol.66 , pp. 277
- Xu, J.Q.¹ Pan, Y.Q.² Shun, Y.A.³ Tian, Z.Z.⁴

20
- 43849094506
- J. W. Kim K. Y. Yang S. H. Hong H. Lee Appl. Surf. Sci. 2008 254 5607
- (2008) Appl. Surf. Sci. , vol.254 , pp. 5607
- Kim, J.W.¹ Yang, K.Y.² Hong, S.H.³ Lee, H.⁴

21
- 69749101533
- K. Y. Yang K. M. Yoon K. W. Choi H. Lee Microelectron. Eng. 2009 86 2228
- (2009) Microelectron. Eng. , vol.86 , pp. 2228
- Yang, K.Y.¹ Yoon, K.M.² Choi, K.W.³ Lee, H.⁴

22
- 80053380350
- S. H. Lee K. J. Byeon H. W. Park J. Y. Cho K. Y. Yang H. Lee Microelectron. Eng. 2011 88 3278
- (2011) Microelectron. Eng. , vol.88 , pp. 3278
- Lee, S.H.¹ Byeon, K.J.² Park, H.W.³ Cho, J.Y.⁴ Yang, K.Y.⁵ Lee, H.⁶

23
- 67651121622
- X. M. Zhang M. Y. Lu Y. Zhang L. J. Chen Z. L. Wang Adv. Mater. 2009 21 2767
- (2009) Adv. Mater. , vol.21 , pp. 2767
- Zhang, X.M.¹ Lu, M.Y.² Zhang, Y.³ Chen, L.J.⁴ Wang, Z.L.⁵

24
- 77953846329
- F. J. Tsai J. Y. Wang J. J. Huang Y. W. Kiang C. C. Yang Opt. Express 2010 18 A207
- (2010) Opt. Express , vol.18 , pp. 207
- Tsai, F.J.¹ Wang, J.Y.² Huang, J.J.³ Kiang, Y.W.⁴ Yang, C.C.⁵

25
- 84862908276
- J. Y. Cho K. J. Byeon H. W. Park J. Kim H. S. Kim H. Lee Nanoscale Res. Lett. 2011 6 578
- (2011) Nanoscale Res. Lett. , vol.6 , pp. 578
- Cho, J.Y.¹ Byeon, K.J.² Park, H.W.³ Kim, J.⁴ Kim, H.S.⁵ Lee, H.⁶

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