SCOPUS 정보 검색 플랫폼 - 논문 보기

메뉴 건너뛰기

Applied Physics Letters

Volumn 101, Issue 21, 2012, Pages

The effect of sample resistivity on Kelvin probe force microscopy

(2) Weymouth, A J a Giessibl, F J a

a UNIVERSITY OF REGENSBURG (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED BIAS; ELECTROSTATIC ATTRACTIONS; KELVIN PROBE FORCE MICROSCOPY; LOCAL ELECTRONIC STRUCTURES; OHMIC VOLTAGE; TUNNELING CURRENT;

ATOMIC FORCE MICROSCOPY; ELECTRONIC STRUCTURE;

PROBES;

EID: 84869987588 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.4766185 Document Type: Article

Times cited : (9)

References (20)

1
- 33745604763
- 10.1063/1.105227
- M. Nonnenmacher, M. P. OBoyle, and H. K. Wickramasinghe, Appl. Phys. Lett. 58, 2921 (1991). 10.1063/1.105227
- (1991) Appl. Phys. Lett. , vol.58 , pp. 2921
- Nonnenmacher, M.¹ Oboyle, M.P.² Wickramasinghe, H.K.³

2
- 79960621383
- 10.1103/PhysRevLett.106.226801
- A. J. Weymouth, T. Wutscher, J. Welker, T. Hofmann, and F. Giessibl, Phys. Rev. Lett. 106, 226801 (2011). 10.1103/PhysRevLett.106.226801
- (2011) Phys. Rev. Lett. , vol.106 , pp. 226801
- Weymouth, A.J.¹ Wutscher, T.² Welker, J.³ Hofmann, T.⁴ Giessibl, F.⁵

3
- 84861671043
- 10.1103/PhysRevB.85.195426
- T. Wutscher, A. Weymouth, and F. Giessibl, Phys. Rev. B 85, 195426 (2012). 10.1103/PhysRevB.85.195426
- (2012) Phys. Rev. B , vol.85 , pp. 195426
- Wutscher, T.¹ Weymouth, A.² Giessibl, F.³

4
- 84865072860
- 10.1103/PhysRevB.86.075407
- A. Sadeghi, A. Baratoff, S. Ghasemi, S. Goedecker, T. Glatzel, S. Kawai, and E. Meyer, Phys. Rev. B 86, 075407 (2012) 10.1103/PhysRevB.86.075407.
- (2012) Phys. Rev. B , vol.86 , pp. 075407
- Sadeghi, A.¹ Baratoff, A.² Ghasemi, S.³ Goedecker, S.⁴ Glatzel, T.⁵ Kawai, S.⁶ Meyer, E.⁷

5
- 33644983425
- 10.1088/0957-4484/17/7/S09
- C. Barth and C. R. Henry, Nanotechnology 17, S155 (2006). 10.1088/0957-4484/17/7/S09
- (2006) Nanotechnology , vol.17 , pp. 155
- Barth, C.¹ Henry, C.R.²

6
- 68649095215
- 10.1103/PhysRevLett.103.036802
- L. Nony, A. Foster, F. Bocquet, and C. Loppacher, Phys. Rev. Lett. 103, 036802 (2009). 10.1103/PhysRevLett.103.036802
- (2009) Phys. Rev. Lett. , vol.103 , pp. 036802
- Nony, L.¹ Foster, A.² Bocquet, F.³ Loppacher, C.⁴

7
- 67149108352
- 10.1126/science.1172273
- L. Gross, F. Mohn, P. Liljeroth, J. Repp, F. J. Giessibl, and G. Meyer, Science 324, 1428 (2009). 10.1126/science.1172273
- (2009) Science , vol.324 , pp. 1428
- Gross, L.¹ Mohn, F.² Liljeroth, P.³ Repp, J.⁴ Giessibl, F.J.⁵ Meyer, G.⁶

8
- 84859622351
- 10.1038/nnano.2012.20
- F. Mohn, L. Gross, N. Moll, and G. Meyer, Nat. Nanotechnol. 7, 227 (2012). 10.1038/nnano.2012.20
- (2012) Nat. Nanotechnol. , vol.7 , pp. 227
- Mohn, F.¹ Gross, L.² Moll, N.³ Meyer, G.⁴

9
- 79551628953
- 10.1103/PhysRevB.83.035411
- F. Bocquet, L. Nony, and C. Loppacher, Phys. Rev. B 83, 035411 (2011). 10.1103/PhysRevB.83.035411
- (2011) Phys. Rev. B , vol.83 , pp. 035411
- Bocquet, F.¹ Nony, L.² Loppacher, C.³

10
- 19544376453
- 10.1103/PhysRevB.70.085320
- Y. Rosenwaks, R. Shikler, T. Glatzel, and S. Sadewasser, Phys. Rev. B 70, 085320 (2004). 10.1103/PhysRevB.70.085320
- (2004) Phys. Rev. B , vol.70 , pp. 085320
- Rosenwaks, Y.¹ Shikler, R.² Glatzel, T.³ Sadewasser, S.⁴

11
- 73649087998
- 10.1103/PhysRevLett.103.266103
- S. Sadewasser, P. Jelínek, C.-K. Fang, O. Custance, Y. Yamada, Y. Sugimoto, M. Abe, and S. Morita, Phys. Rev. Lett. 103, 266103 (2009). 10.1103/PhysRevLett.103.266103
- (2009) Phys. Rev. Lett. , vol.103 , pp. 266103
- Sadewasser, S.¹ Jelínek, P.² Fang, C.-K.³ Custance, O.⁴ Yamada, Y.⁵ Sugimoto, Y.⁶ Abe, M.⁷ Morita, S.⁸

12
- 0038981463
- 10.1063/1.347347
- T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys. 69, 668 (1991). 10.1063/1.347347
- (1991) J. Appl. Phys. , vol.69 , pp. 668
- Albrecht, T.R.¹ Grütter, P.² Horne, D.³ Rugar, D.⁴

13
- 0141990921
- 10.1103/RevModPhys.75.949
- F. J. Giessibl, Rev. Mod. Phys. 75, 949 (2003). 10.1103/RevModPhys.75.949
- (2003) Rev. Mod. Phys. , vol.75 , pp. 949
- Giessibl, F.J.¹

14
- 70350704896
- 10.1103/PhysRevB.80.125326
- S. Modesti, H. Gutzmann, J. Wiebe, and R. Wiesendanger, Phys. Rev. B 80, 125326 (2009). 10.1103/PhysRevB.80.125326
- (2009) Phys. Rev. B , vol.80 , pp. 125326
- Modesti, S.¹ Gutzmann, H.² Wiebe, J.³ Wiesendanger, R.⁴

15
- 81055154915
- 10.1143/APEX.4.115201
- K.-i. Morita, Y. Sugimoto, M. Abe, and S. Morita, Appl. Phys. Express 4, 115201 (2011). 10.1143/APEX.4.115201
- (2011) Appl. Phys. Express , vol.4 , pp. 115201
- Morita, K.-I.¹ Sugimoto, Y.² Abe, M.³ Morita, S.⁴

16
- 84857222283
- 10.1088/0953-8984/24/8/084008
- Y. Sugimoto, K. Ueda, M. Abe, and S. Morita, J. Phys.: Condens. Matter 24, 084008 (2012). 10.1088/0953-8984/24/8/084008
- (2012) J. Phys.: Condens. Matter , vol.24 , pp. 084008
- Sugimoto, Y.¹ Ueda, K.² Abe, M.³ Morita, S.⁴

17
- 0031699819
- 10.1007/s100510050219
- S. Hudlet, M. Saint Jean, C. Guthmann, and J. Berger, Eur. Phys. J. B 2, 5 (1998). 10.1007/s100510050219
- (1998) Eur. Phys. J. B , vol.2 , pp. 5
- Hudlet, S.¹ Saint Jean, M.² Guthmann, C.³ Berger, J.⁴

18
- 55049142110
- 10.1103/PhysRevLett.101.176101
- P. Jelínek, M. Švec, P. Pou, R. Perez, and V. Cháb, Phys. Rev. Lett. 101, 176101 (2008). 10.1103/PhysRevLett.101.176101
- (2008) Phys. Rev. Lett. , vol.101 , pp. 176101
- Jelínek, P.¹ Švec, M.² Pou, P.³ Perez, R.⁴ Cháb, V.⁵

19
- 77954330695
- 10.1103/PhysRevB.81.245322
- Y. Sugimoto, Y. Nakajima, D. Sawada, K. Morita, M. Abe, and S. Morita, Phys. Rev. B 81, 245322 (2010). 10.1103/PhysRevB.81.245322
- (2010) Phys. Rev. B , vol.81 , pp. 245322
- Sugimoto, Y.¹ Nakajima, Y.² Sawada, D.³ Morita, K.⁴ Abe, M.⁵ Morita, S.⁶

20
- 84862908395
- 10.1126/science.1214319
- B. Weber, S. Mahapatra, H. Ryu, S. Lee, A. Fuhrer, T. C. G. Reusch, D. L. Thompson, W. C. T. Lee, G. Klimeck, L. C. L. Hollenberg, and M. Y. Simmons, Science 335, 64 (2012). 10.1126/science.1214319
- (2012) Science , vol.335 , pp. 64
- Weber, B.¹ Mahapatra, S.² Ryu, H.³ Lee, S.⁴ Fuhrer, A.⁵ Reusch, T.C.G.⁶ Thompson, D.L.⁷ Lee, W.C.T.⁸ Klimeck, G.⁹ Hollenberg, L.C.L.¹⁰ Simmons, M.Y.¹¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.