Efficient SRAM failure rate prediction via Gibbs sampling

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Volumn 31, Issue 12, 2012, Pages 1831-1844

  Sun, Shupeng ^a   Feng, Yamei ^a   Dong, Changdao ^a   Li, Xin ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

Failure rate; Gibbs sampling; Monte Carlo analysis; process variation; SRAM

Indexed keywords

CARTESIANS; COMPUTATIONAL COSTS; CONFIDENCE INTERVAL; FAILURE EVENTS; FAILURE PROBABILITY; FAILURE RATE; GIBBS SAMPLING; INTEGRATED OPTIMIZATION; MONTE CARLO ANALYSIS; POINT SELECTION; PREDICTION ACCURACY; PROCESS VARIATION; RANDOM SAMPLING; RELATIVE ERRORS; RUNTIMES; SPHERICAL COORDINATE SYSTEMS; SRAM CELL; SRAM FAILURES; TRADITIONAL TECHNIQUES; TRANSISTOR-LEVEL SIMULATION;

FAILURE ANALYSIS; FORECASTING; LEARNING ALGORITHMS; OPTIMIZATION; PROBABILITY DISTRIBUTIONS; PROGRAM PROCESSORS; SAMPLING; STATIC RANDOM ACCESS STORAGE;

IMPORTANCE SAMPLING;

EID: 84869395346     PISSN: 02780070     EISSN: None     Source Type: Journal    
DOI: 10.1109/TCAD.2012.2209884     Document Type: Article

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