2.4 Gbps, 7 mW all-digital PVT-variation tolerant true random number generator for 45 nm CMOS high-performance microprocessors

IEEE Journal of Solid-State Circuits

Volumn 47, Issue 11, 2012, Pages 2807-2821

  Mathew, Sanu K ^a   Srinivasan, Suresh ^a   Anders, Mark A ^a   Kaul, Himanshu ^a   Hsu, Steven K ^a   Sheikh, Farhana ^a   Agarwal, Amit ^a   Satpathy, Sudhir ^a   Krishnamurthy, Ram K ^a  

^a INTEL RESEARCH   (United States)

Author keywords

all digital; encryption; entropy generation; key generation; metastability; security; True random number generator (TRNG)

Indexed keywords

ALL-DIGITAL; ENTROPY GENERATION; KEY-GENERATION; METASTABILITIES; RANDOM NUMBER GENERATORS; SECURITY;

CRYPTOGRAPHY; ELECTRONIC EQUIPMENT TESTING; MICROPROCESSOR CHIPS; PROBABILITY DISTRIBUTIONS; RANDOM NUMBER GENERATION;

ENTROPY;

EID: 84869162885     PISSN: 00189200     EISSN: None     Source Type: Journal    
DOI: 10.1109/JSSC.2012.2217631     Document Type: Article

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