Design of an on-chip random number generator using metastability

European Solid-State Circuits Conference

Volumn , Issue , 2002, Pages 595-598

  Kinniment, D J ^a   Chester, E G ^a  

^a NEWCASTLE UNIVERSITY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

FEED-BACK LOOP; MEASUREMENTS OF; METASTABILITIES; ON-CHIP INTEGRATION; PRIMARY SOURCES; RANDOM NUMBER GENERATORS; STRINGENT TEST; THERMAL AGITATION;

RANDOM NUMBER GENERATION;

EID: 84893733945     PISSN: 19308833     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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4. C Dike and E Burton "Miller and Noise Effects in a Synchronizing Flip-Flop" IEEE Journal of Solid State Circuits Vol. 34 No. 6, pp849-855, June 1999
5. G. R. Couranz., and D.F. Wann, "The theoretical and experimental behaviour of synchronizers operating in the metastable region", IEEE Transactions on Computers C-24, (6) pp. 604-616 June 1975.
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9. G. Marsaglia, "A Current view of Random Number Generators" Keynote address, Proc. Computer Science and Statistics, 16th symposium on the Interface Elsevier 1985.
10. D.E.Knuth "The art of Computer Programming" 3rd Edition, Addison Wesley, Reading MA, 1998, p75.