1200μm2 physical random-number generators based on SiN MOSFET for secure smart-card application

Digest of Technical Papers - IEEE International Solid-State Circuits Conference

Volumn 51, Issue , 2008, Pages 414-624

  Matsumoto, Mari ^a   Yasuda, Shinichi ^a   Ohba, Ryuji ^a   Ikegami, Kazutaka ^a   Tanamoto, Tetsufumi ^a   Fujita, Shinobu ^a  

^a TOSHIBA CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANALOG TO DIGITAL CONVERSION; HARDWARE SECURITY; MOSFET DEVICES; NUMBER THEORY; SILICON NITRIDE; SMART CARDS;

A/D CONVERTER; HIGH QUALITY; MOS-FET; PHYSICAL RANDOM NUMBER GENERATORS; RANDOM NUMBERS; SMART-CARD APPLICATION;

RANDOM NUMBER GENERATION;

EID: 49549099300     PISSN: 01936530     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ISSCC.2008.4523233     Document Type: Conference Paper

References (5)

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2. C. Tokunaga, D. Blaauw, T. Mudge, "True Random Number Generator with a Metastability-Based Quality Control," ISSCC Dig. Tech. Papers, pp. 404-405, Feb. 2007.
3. Craig S. Petrie and J. Alvin Connelly, "Noise-Based IC Random Number Generator for Applications in Cryptography," Trans. Circuits Systems - I: Fundamental Theory and Applications, vol. 47, no. 5, pp. 615-621, May 2000
4. M. Bucci, L. Germani, R. Luzzi et al., "A High-Speed Oscillator-Based Truly Random Number Source for Cryptographic Applications on Smart Card IC," Trans. Computers, vol. 52, no.4, pp. 403-409, April 2003.
5. S. Fujita, K. Uchida, S. Yauda et al., "Si Nanodevices for Random Number Generator Circuits for Cryptographic Security," ISSCC Dig. Tech. Papers, pp. 294-295, Feb. 2004.