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Advanced Functional Materials

Volumn 22, Issue 22, 2012, Pages 4833-4839

Bias-stress-induced charge trapping at polymer chain ends of polymer gate-dielectrics in organic transistors

(3) Choi, Hyun Ho a Lee, Wi Hyoung a Cho, Kilwon a

a Pohang University of Science and Technology (POSTECH) (South Korea)

Author keywords

bias stress stability; free volume; molecular weight; polymer chain ends; polymer gate dielectrics

Indexed keywords

AMBIENT AIR; BIAS STRESS; CHAIN-ENDS; CHARGE TRAP; ORGANIC TRANSISTOR; POLYMER CHAINS; THRESHOLD VOLTAGE SHIFTS; TRAP CHARGE; TRAP DENSITY; WATER MOLECULE;

CHARGE TRAPPING; FREE VOLUME; HYDROGEN; MOLECULAR WEIGHT; MOLECULES; ORGANIC FIELD EFFECT TRANSISTORS; POLYSTYRENES; STABILITY;

GATE DIELECTRICS;

EID: 84869050766 PISSN: 1616301X EISSN: 16163028 Source Type: Journal
DOI: 10.1002/adfm.201201084 Document Type: Article

Times cited : (73)

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